Search Results - "Sanchez, E.K."

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  1. 1

    Volume production of high quality SiC substrates and epitaxial layers: Defect trends and device applications by Müller, St.G., Sanchez, E.K., Hansen, D.M., Drachev, R.D., Chung, G., Thomas, B., Zhang, J., Loboda, M.J., Dudley, M., Wang, H., Wu, F., Byrappa, S., Raghothamachar, B., Choi, G.

    Published in Journal of crystal growth (01-08-2012)
    “…We review the progress of silicon carbide (SiC) bulk growth by the sublimation method, highlighting recent advances at Dow Corning, which resulted in the…”
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    Journal Article Conference Proceeding
  2. 2

    Studies of the Origins of Half-Loop Arrays and Interfacial Dislocations Observed in Homoepitaxial Layers of 4H-SiC by Wang, H., Dudley, M., Wu, F., Yang, Y., Raghothamachar, B., Zhang, J., Chung, G., Thomas, B., Sanchez, E.K., Mueller, S.G., Hansen, D., Loboda, M.J.

    Published in Journal of electronic materials (01-05-2015)
    “…Synchrotron x-ray topography and KOH etching studies have been carried out on n -type 4H-SiC offcut substrates before and after homoepitaxial growth to study…”
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    Journal Article
  3. 3

    Origin of basal plane bending in hexagonal silicon carbide single crystals by Lee, J.W., Skowronski, M., Sanchez, E.K., Chung, G.

    Published in Journal of crystal growth (15-08-2008)
    “…4H-SiC crystals grown by the physical vapor transport method were investigated using high-resolution X-ray diffraction, defect selective etching, and…”
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    Journal Article
  4. 4

    Formation of thermal decomposition cavities in physical vapor transport of silicon carbide by Sanchez, Edward K., Kuhr, Thomas, Heydemann, Volker D., Snyder, David W., Rohrer, Gregory S., Skowronski, Marek

    Published in Journal of electronic materials (01-03-2000)
    “…The relationship between seed mounting and the formation of thermal decomposition cavities in physical vapor transport grown silicon carbide was investigated…”
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    Journal Article