Search Results - "Salazar Bloise, Félix"

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  1. 1

    Non-Contact Roughness Measurement in Sub-Micron Range by Considering Depolarization Effects by Pöller, Franziska, Salazar Bloise, Félix, Jakobi, Martin, Wang, Shengjia, Dong, Jie, Koch, Alexander W

    Published in Sensors (Basel, Switzerland) (14-05-2019)
    “…The characteristics of a surface, particularly the roughness, play an important role in different fields of the industry and have to be considered to ensure…”
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    Journal Article
  2. 2

    Low-pass filtering compensation in common-path digital holographic microscopy by Dong, Jie, Yetisen, Ali K., Dong, Xingchen, Pöller, Franziska, Jakobi, Martin, Liu, Zhanwei, Salazar Bloise, Félix, Koch, Alexander W.

    Published in Applied physics letters (21-09-2020)
    “…A low-pass filtering compensation (LPFC) method is proposed to compensate for phase aberrations in point diffraction-based common-path digital holographic…”
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    Journal Article
  3. 3

    Non-Contact Surface Roughness Measurement by Implementation of a Spatial Light Modulator by Aulbach, Laura, Salazar Bloise, Félix, Lu, Min, Koch, Alexander W

    Published in Sensors (Basel, Switzerland) (15-03-2017)
    “…The surface structure, especially the roughness, has a significant influence on numerous parameters, such as friction and wear, and therefore estimates the…”
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    Journal Article
  4. 4

    Extension and Limits of Depolarization-Fringe Contrast Roughness Method in Sub-Micron Domain by Pöller, Franziska, Salazar Bloise, Félix, Jakobi, Martin, Dong, Jie, Koch, Alexander W.

    Published in Sensors (Basel, Switzerland) (19-08-2021)
    “…To guarantee quality standards for the industry, surface properties, particularly those of roughness, must be considered in many areas of application. Today,…”
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    Journal Article
  5. 5

    Real-time dual-sensitive shearography for simultaneous in-plane and out-of-plane strain measurements by Dong, Jie, Wang, Shengjia, Lu, Min, Jakobi, Martin, Liu, Zhanwei, Dong, Xingchen, Pöller, Franziska, Bilgeri, Laura Maria, Bloise, Félix Salazar, Yetisen, Ali K, Koch, Alexander Walter

    Published in Optics express (04-02-2019)
    “…A real-time, dual-sensitive shearography system using a single-wavelength laser was developed for simultaneous and dynamic in-plane and out-of-plane strain…”
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    Journal Article
  6. 6

    Vector Differential Interference Contrast Microscopy Based on a 3‑in‑1 Phase Mask through a Dynamic Diffractive Optical Element by Gao, Shuai, Xiong, Jianxuan, Yetisen, Ali K., Salazar-Bloise, Félix, Koch, Alexander W., Yang, Xinghua, Wang, Shengjia

    Published in ACS photonics (17-01-2024)
    “…Differential interference contrast (DIC) microscopy is highly desirable in label-free imaging for transparent biological samples. It avoids potential…”
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    Journal Article
  7. 7

    Temporal electronic speckle pattern interferometry for real-time in-plane rotation analysis by Wang, Shengjia, Lu, Min, Bilgeri, Laura Maria, Jakobi, Martin, Bloise, Félix Salazar, Koch, Alexander W

    Published in Optics express (02-04-2018)
    “…A temporal electronic speckle pattern interferometry (ESPI) system is proposed for in-plane rotation measurement. The relationship between the rotation angle…”
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    Journal Article
  8. 8
  9. 9

    Creation of localized optical waves that Do not obey the radiation condition at infinity by Porras, MA, Salazar-Bloise, F, Vazquez, L

    Published in Physical review letters (04-09-2000)
    “…We show that the diffraction of a shocking optical pulse formed in a nonlinear transparent dielectric creates an optical missile, or localized radiation field…”
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    Journal Article