Search Results - "Sakamoto, Kinihiro"
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Reflection high-energy electron diffraction intensity oscillations during GexSi1-x MBE growth on Si(001) substrates
Published in Japanese journal of applied physics (01-05-1987)Get full text
Journal Article -
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Reflection High-Energy Electron Diffraction Intensity Oscillations during Ge x Si 1-x MBE Growth on Si(001) Substrates
Published in Japanese Journal of Applied Physics (01-05-1987)“…Reflection high-energy electron diffraction (RHEED) intensity oscillations during the heteroepitaxy of Ge x Si 1- x on a Si(001) substrate were observed for…”
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Journal Article