Search Results - "Saito, Michiaki"
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Measurement and Modeling of Ambient-Air-Induced Degradation in Organic Thin-Film Transistor
Published in IEEE transactions on semiconductor manufacturing (01-05-2020)“…The lifetime of organic thin-film transistors (OTFTs) is known to be significantly shorter than that of silicon MOSFETs. It is therefore important to be able…”
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Journal Article -
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A compact model of I -V characteristic degradation for organic thin film transistors
Published in 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) (01-03-2019)“…The lifetime of organic thin film transistors is known to be significantly shorter than that of silicon MOSFETs. It is hence important to predict their…”
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Conference Proceeding
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3
Measurement and Modeling of Frequency Degradation of an oTFT Ring Oscillator
Published in 2018 14th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01-10-2018)“…Organic thin lm transistors (oTFTs) and a ring oscillator (RO) are fabricated to model their temporal degradations. The changes of threshold voltage and…”
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Conference Proceeding