Search Results - "SHARD, A. G"

Organic Depth Profiling of a Nanostructured Delta Layer Reference Material Using Large Argon Cluster Ions by Lee, J. L. S, Ninomiya, S, Matsuo, J, Gilmore, I. S, Seah, M. P, Shard, A. G

“…Cluster ion beams have revolutionized the analysis of organic surfaces in time-of-flight secondary ion mass spectrometry and opened up new capabilities for…”
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Angle Dependence of Argon Gas Cluster Sputtering Yields for Organic Materials by Seah, M. P, Spencer, S. J, Shard, A. G

“…The first angle-dependent measurements of the sputtering yield of an organic material using argon gas cluster ions under a wide range of conditions are…”
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Comparisons of Analytical Approaches for Determining Shell Thicknesses of Core–Shell Nanoparticles by X‑ray Photoelectron Spectroscopy by Powell, C. J, Werner, W. S. M, Kalbe, H, Shard, A. G, Castner, D. G

“…We assessed two approaches for determining shell thicknesses of core–shell nanoparticles (NPs) by X-ray photoelectron spectroscopy (XPS). These assessments…”
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Evaluating the Internal Structure of Core–Shell Nanoparticles Using X‑ray Photoelectron Intensities and Simulated Spectra by Chudzicki, M, Werner, W. S. M, Shard, A. G, Wang, Y.-C, Castner, D. G, Powell, C. J

“…The functionality of a new version of the National Institute of Standards and Technology Database for the Simulation of Electron Spectra for Surface Analysis…”
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Sputtering Yields for Mixtures of Organic Materials Using Argon Gas Cluster Ions by Seah, M. P, Havelund, R, Shard, A. G, Gilmore, I. S

“…The sputtering yield volumes of binary mixtures of Irganox 1010 with either Irganox 1098 or Fmoc-pentafluoro-l-phenylalanine (FMOC) have been measured for 5…”
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Sample Cooling or Rotation Improves C60 Organic Depth Profiles of Multilayered Reference Samples: Results from a VAMAS Interlaboratory Study by Sjövall, P, Rading, D, Ray, S, Yang, L, Shard, A. G

“…We demonstrate two methods to improve the quality of organic depth profiling by C60 sputtering using multilayered reference samples as part of a VAMAS…”
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Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster size by Seah, M P, Spencer, S J, Havelund, R, Gilmore, I S, Shard, A G

“…An analysis is presented of the effect of experimental parameters such as energy, angle and cluster size on the depth resolution in depth profiling organic…”
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Film thickness measurement and contamination layer correction for quantitative XPS by Walton, J., Alexander, M. R., Fairley, N., Roach, P., Shard, A. G.

“…In order to determine the most appropriate method of measuring film thickness using imaging XPS, a series of thin polymer films have been prepared and analysed…”
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Evaluation of Two Methods for Determining Shell Thicknesses of Core–Shell Nanoparticles by X‑ray Photoelectron Spectroscopy by Powell, C. J, Werner, W. S. M, Shard, A. G, Castner, D. G

“…We evaluated two methods for determining shell thicknesses of core–shell nanoparticles (NPs) by X-ray photoelectron spectroscopy. One of these methods had been…”
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Chemical and spatial analysis of protein loaded PLGA microspheres for drug delivery applications by Rafati, A., Boussahel, A., Shakesheff, K.M., Shard, A.G., Roberts, C.J., Chen, X., Scurr, D.J., Rigby-Singleton, S., Whiteside, P., Alexander, M.R., Davies, M.C.

“…Polymer microspheres for controlled release of therapeutic protein from within an implantable scaffold were produced and analysed using complimentary…”
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Measurement of sputtering yields and damage in C60 SIMS depth profiling of model organic materials by Shard, A. G., Brewer, P. J., Green, F. M., Gilmore, I. S.

“…Sputter‐depth profiles of model organic thin films on silicon using C60 primary ions have been employed to measure sputtering yields and depth resolution…”
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XPS topofactors: determining overlayer thickness on particles and fibres by Shard, A. G., Wang, J., Spencer, S. J.

“…We introduce the concept of an XPS ‘Topofactor’, which can be used in conjunction with the XPS ‘Thickogram’, to provide overlayer thicknesses on topographic…”
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VAMAS interlaboratory study on organic depth profiling by Shard, A. G., Ray, S., Seah, M. P., Yang, L.

“…We present the results of a VAMAS (Versailles project on Advanced Materials and Standards) interlaboratory study on organic depth profiling, in which twenty…”
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Dual beam organic depth profiling using large argon cluster ion beams by Holzweber, M., Shard, A. G., Jungnickel, H., Luch, A., Unger, W. E. S.

“…Argon cluster sputtering of an organic multilayer reference material consisting of two organic components, 4,4′‐bis[N‐(1‐naphthyl‐1‐)‐N‐phenyl‐ amino]‐biphenyl…”
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Characterization of IgG-protein-coated polymeric nanoparticles using complementary particle sizing techniques by Minelli, C., Garcia-Diez, R., Sikora, A. E., Gollwitzer, C., Krumrey, M., Shard, A. G.

“…When nanoparticles are introduced into biological media, they acquire a protein corona. The thickness of immunoglobulin G protein on 105 nm polystyrene…”
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Effects of Annealing on the Surface Composition and Morphology of PS/PMMA Blend by Ton-That, C, Shard, A. G, Daley, R, Bradley, R. H

“…Films of polystyrene (PS) and poly(methyl methacrylate) (PMMA) blend have been annealed at a temperature above their glass transition temperatures for up to 48…”
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Depth resolution and inhomogeneity of the sputtering dose with sample rotation and ion beam rastering by Shard, A. G., Seah, M. P.

“…Sample rotation during sputter depth profiling can improve the measured depth resolution. We examine some of the practical issues of particular relevance to…”
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VAMAS interlaboratory study on organic depth profiling. Part I: Preliminary report by Shard, A. G., Foster, R., Gilmore, I. S., Lee, J. L. S., Ray, S., Yang, L.

“…We present preliminary results of a VAMAS interlaboratory study on organic depth profiling, TWA2, sub‐project A3 (d). A layered organic system was used to…”
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Surface feature size of spin cast PS/PMMA blends by Ton-That, C, Shard, A.G, Bradley, R.H

“…Thin films of polystyrene (PS)/polymethylmethacrylate (PMMA) blends have been spin cast on mica from chloroform solutions. When the concentration of PMMA in…”
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Thickness of Spin-Cast Polymer Thin Films Determined by Angle-Resolved XPS and AFM Tip-Scratch Methods by Ton-That, C, Shard, A. G, Bradley, R. H

“…Polystyrene (PS) and poly(methyl methacrylate) (PMMA) thin films (<100 nm thickness) have been spin-cast from chloroform solution onto cleaved mica surfaces…”
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