Search Results - "Ruess, F J"

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  1. 1

    Atomically precise placement of single dopants in si by Schofield, S R, Curson, N J, Simmons, M Y, Ruess, F J, Hallam, T, Oberbeck, L, Clark, R G

    Published in Physical review letters (26-09-2003)
    “…We demonstrate the controlled incorporation of P dopant atoms in Si(001), presenting a new path toward the creation of atomic-scale electronic devices. We…”
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    Journal Article
  2. 2

    Atomic structure of Mn wires on Si(001) resolved by scanning tunneling microscopy by Fuhrer, A, Rueß, F J, Moll, N, Curioni, A, Widmer, D

    Published in Physical review letters (03-10-2012)
    “…At submonolayer coverage, Mn forms atomic wires on the Si(001) surface oriented perpendicular to the underlying Si dimer rows. While many other elements form…”
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    Journal Article
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    Scanning probe microscopy for silicon device fabrication by Simmons, M.Y., Ruess, F.J., Goh, K.E.J., Hallam, T., Schofield, S.R., Oberbeck, L., Curson, N.J., Hamilton, A.R., Butcher, M.J., Clark, R.G., Reusch, T.C.G.

    Published in Molecular simulation (01-05-2005)
    “…We present a review of a detailed fabrication strategy for the realisation of nano and atomic-scale devices in silicon using phosphorus as a dopant and a…”
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  7. 7

    Quantum states of neutrons in the Earth's gravitational field by Nesvizhevsky, Valery V, Börner, Hans G, Petukhov, Alexander K, Abele, Hartmut, Baeßler, Stefan, Rueß, Frank J, Stöferle, Thilo, Westphal, Alexander, Gagarski, Alexei M, Petrov, Guennady A, Strelkov, Alexander V

    Published in Nature (London) (17-01-2002)
    “…The discrete quantum properties of matter are manifest in a variety of phenomena. Any particle that is trapped in a sufficiently deep and wide potential well…”
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  8. 8

    Ohmic conduction of sub-10nm P-doped silicon nanowires at cryogenic temperatures by Rueß, F. J., Micolich, A. P., Pok, W., Goh, K. E. J., Hamilton, A. R., Simmons, M. Y.

    Published in Applied physics letters (04-02-2008)
    “…We investigate the conduction properties of an embedded, highly phosphorus-doped nanowire with a width of 8nm lithographically defined by scanning tunneling…”
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  9. 9

    Effective removal of hydrogen resists used to pattern devices in silicon using scanning tunneling microscopy by Hallam, T., Rueß, F. J., Curson, N. J., Goh, K. E. J., Oberbeck, L., Simmons, M. Y., Clark, R. G.

    Published in Applied physics letters (04-04-2005)
    “…We present a high resolution scanning tunneling microscope (STM) study of the thermal desorption of hydrogen resist layers used for STM-based lithography on…”
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    Journal Article
  10. 10

    Ohmic conduction of sub- 10 nm P-doped silicon nanowiresat cryogenic temperatures by Rueß, F. J., Micolich, A. P., Pok, W., Goh, K. E. J., Hamilton, A. R., Simmons, M. Y.

    Published in Applied physics letters (04-02-2008)
    “…We investigate the conduction properties of an embedded, highly phosphorus-doped nanowire with a width of 8 nm lithographically defined by scanning tunneling…”
    Get full text
    Journal Article
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    Structural and electrical characterization of room temperatureultra-high-vacuum compatible Si O 2 for gating scanning tunneling microscope-patterned devices by Scappucci, G., Ratto, F., Thompson, D. L., Reusch, T. C. G., Pok, W., Rueß, F. J., Rosei, F., Simmons, M. Y.

    Published in Applied physics letters (28-11-2007)
    “…We present an ultrahigh vacuum technique for depositing SiO 2 at room temperature using an atomic oxygen source and Si coevaporation for ultimate use as a…”
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    Journal Article
  13. 13

    Structural and electrical characterization of room temperature ultra-high-vacuum compatible SiO2 for gating scanning tunneling microscope-patterned devices by Scappucci, G., Ratto, F., Thompson, D. L., Reusch, T. C. G., Pok, W., Rueß, F. J., Rosei, F., Simmons, M. Y.

    Published in Applied physics letters (26-11-2007)
    “…We present an ultrahigh vacuum technique for depositing SiO2 at room temperature using an atomic oxygen source and Si coevaporation for ultimate use as a…”
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    Journal Article
  14. 14

    Effective removal of hydrogen resists used to pattern devicesin silicon using scanning tunneling microscopy by Hallam, T., Rueß, F. J., Curson, N. J., Goh, K. E. J., Oberbeck, L., Simmons, M. Y., Clark, R. G.

    Published in Applied physics letters (01-04-2005)
    “…We present a high resolution scanning tunneling microscope (STM) study of the thermal desorption of hydrogen resist layers used for STM-based lithography on…”
    Get full text
    Journal Article
  15. 15

    Toward Atomic-Scale Device Fabrication in Silicon Using Scanning Probe Microscopy by Ruess, Frank J, Oberbeck, Lars, Simmons, Michelle Y, Goh, Kuan Eng J, Hamilton, Alex R, Hallam, Toby, Schofield, Steven R, Curson, Neil J, Clark, Robert G

    Published in Nano letters (01-10-2004)
    “…We present a complete fabrication process for the creation of robust nano-and atomic-scale devices in silicon using a scanning tunneling microscope (STM). In…”
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    Journal Article
  16. 16

    Atomic structure of Mn wires on Si(001) resolved by scanning tunneling microscopy by Fuhrer, A, Rueß, F. J, Moll, N, Curioni, A, Widmer, D

    Published 02-05-2012
    “…At submonolayer coverage, Mn forms atomic wires on the Si(001) surface oriented perpendicular to the underlying Si dimer rows. While many other elements form…”
    Get full text
    Journal Article
  17. 17

    Atomically precise placement of single dopants in Si by Schofield, S. R, Curson, N. J, Simmons, M. Y, Ruess, F. J, Hallam, T, Oberbeck, L, Clark, R. G

    Published 23-07-2003
    “…We demonstrate the controlled incorporation of P dopant atoms in Si (001) presenting a new path toward the creation of atomic-scale electronic devices. We…”
    Get full text
    Journal Article
  18. 18

    Measurement of quantum states of neutrons in the Earth's gravitational field by Nesvizhevsky, V. V, Boerner, H. G, Gagarsky, A. M, Petoukhov, A. K, Petrov, G. A, Abele, H, Baessler, S, Divkovic, G, Ruess, F. J, Stoeferle, Th, Westphal, A, Strelkov, A. V, Protasov, K. V, Voronin, A. Yu

    Published 21-06-2003
    “…Phys.Rev. D67 (2003) 102002 The lowest stationary quantum state of neutrons in the Earth's gravitational field is identified in the measurement of neutron…”
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    Journal Article