Search Results - "Rubashkina, V V"
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Erratum to: Determination of the Electrical Resistivity of Vertically Aligned Carbon Nanotubes by Scanning Probe Microscopy
Published in Technical physics (01-10-2021)“…An Erratum to this paper has been published: https://doi.org/10.1134/S1063784221080193…”
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Study of the resistive switching of vertically aligned carbon nanotubes by scanning tunneling microscopy
Published in Physics of the solid state (01-04-2015)“…The effect of an external electric field on the electromechanical properties and regularities of the resistive switching of a vertically aligned carbon…”
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Memristor effect on bundles of vertically aligned carbon nanotubes tested by scanning tunnel microscopy
Published in Technical physics (01-12-2013)“…We report on the results of experimental study of an array of vertically aligned carbon nanotubes (VA CNTs) by scanning tunnel microscopy (STM). It is shown…”
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Changes in the relationship between cognitive functioning and psychopathological symptoms in patients with paranoid schizophrenia in the periods of psychosis and development of remission
Published in Zhurnal nevrologii i psikhiatrii imeni S.S. Korsakova (2008)“…The aim of our study was to investigate the relationship between cognitive functioning and psychopathological symptoms in patients with paranoid schizophrenia…”
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Determination of the electrical resistivity of vertically aligned carbon nanotubes by scanning probe microscopy
Published in Technical physics (01-07-2015)“…Techniques are developed to determine the resistance per unit length and the electrical resistivity of vertically aligned carbon nanotubes (VA CNTs) using…”
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Parameters of platelet serotonin system in patients with schizophrenia treated with olanzapine: a search for the serotonergic predictors of therapeutic efficacy
Published in Zhurnal nevrologii i psikhiatrii imeni S.S. Korsakova (2005)“…Fifty-nine patients, 21 women and 38 men, with ICD-10 diagnosis of schizophrenia (F20.0), attack-like type, were treated with olanzapine during 28 weeks…”
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Study of modification methods of probes for critical-dimension atomic-force microscopy by the deposition of carbon nanotubes
Published in Semiconductors (Woodbury, N.Y.) (01-12-2015)“…The results of an experimental study of the modification of probes for critical-dimension atomicforce microscopy (CD-AFM) by the deposition of carbon nanotubes…”
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Studying the effect of geometric parameters of oriented GaAs nanowhiskers on Young’s modulus using atomic force microscopy
Published in Nanotechnologies in Russia (01-02-2013)“…A technique for determining Young’s modulus of oriented nanowhiskers using atomic force microscopy is developed. Results of studying the effect of geometric…”
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Development of a technique for determining Young’s modulus of vertically aligned carbon nanotubes using the nanoindentation method
Published in Nanotechnologies in Russia (01-02-2012)“…A technique for determining Young’s modulus of vertically aligned carbon nanotubes using the refined micromechanical model of the nanoindentation of a forest…”
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The formation of submicron structures on the surface of amorphous silicon films by nanosecond pulsed radiation of a laser line generator
Published in Nanotechnologies in Russia (01-09-2012)“…The experimental results that were shown for the first time in this article concern the formation of nanostructures on the surface of amorphous silicon films…”
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