Search Results - "Roh, Jangho"

A Comparative Study on the Ferroelectric Performances in Atomic Layer Deposited Hf0.5Zr0.5O2 Thin Films Using Tetrakis(ethylmethylamino) and Tetrakis(dimethylamino) Precursors by Kim, Baek Su, Hyun, Seung Dam, Moon, Taehwan, Do Kim, Keum, Lee, Young Hwan, Park, Hyeon Woo, Lee, Yong Bin, Roh, Jangho, Kim, Beom Yong, Kim, Ho Hyun, Park, Min Hyuk, Hwang, Cheol Seong

“…The chemical, physical, and electrical properties of the atomic layer deposited Hf 0.5 Zr 0.5 O 2 thin films using tetrakis(ethylmethylamino) (TEMA) and…”
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Nucleation‐Limited Ferroelectric Orthorhombic Phase Formation in Hf0.5Zr0.5O2 Thin Films by Lee, Young Hwan, Hyun, Seung Dam, Kim, Hae Jin, Kim, Jun Shik, Yoo, Chanyoung, Moon, Taehwan, Kim, Keum Do, Park, Hyeon Woo, Lee, Yong Bin, Kim, Baek Su, Roh, Jangho, Park, Min Hyuk, Hwang, Cheol Seong

“…Various possibilities have been proposed as the cause of the doped‐ or undoped‐HfO2 thin film materials showing unusual ferroelectricity. These assumptions are…”
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Modeling of Negative Capacitance in Ferroelectric Thin Films by Park, Hyeon Woo, Roh, Jangho, Lee, Yong Bin, Hwang, Cheol Seong

“…The negative capacitance (NC) effect in ferroelectric thin films has attracted a great deal of attention from the material and semiconductor device communities…”
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A Comparative Study on the Ferroelectric Performances in Atomic Layer Deposited Hf 0.5 Zr 0.5 O 2 Thin Films Using Tetrakis(ethylmethylamino) and Tetrakis(dimethylamino) Precursors by Kim, Baek Su, Hyun, Seung Dam, Moon, Taehwan, Do Kim, Keum, Lee, Young Hwan, Park, Hyeon Woo, Lee, Yong Bin, Roh, Jangho, Kim, Beom Yong, Kim, Ho Hyun, Park, Min Hyuk, Hwang, Cheol Seong

“…The chemical, physical, and electrical properties of the atomic layer deposited Hf Zr O thin films using tetrakis(ethylmethylamino) (TEMA) and…”
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Nucleation‐Limited Ferroelectric Orthorhombic Phase Formation in Hf 0.5 Zr 0.5 O 2 Thin Films by Lee, Young Hwan, Hyun, Seung Dam, Kim, Hae Jin, Kim, Jun Shik, Yoo, Chanyoung, Moon, Taehwan, Kim, Keum Do, Park, Hyeon Woo, Lee, Yong Bin, Kim, Baek Su, Roh, Jangho, Park, Min Hyuk, Hwang, Cheol Seong

“…Various possibilities have been proposed as the cause of the doped‐ or undoped‐HfO 2 thin film materials showing unusual ferroelectricity. These assumptions…”
Get full text