Search Results - "Rietschel, Robert L"

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    Patch-test results of the North American Contact Dermatitis Group 2005-2006 by Zug, Kathryn A, Warshaw, Erin M, Fowler, Jr, Joseph F, Maibach, Howard I, Belsito, Donald L, Pratt, Melanie D, Sasseville, Denis, Storrs, Frances J, Taylor, James S, Mathias, C G Toby, Deleo, Vincent A, Rietschel, Robert L, Marks, James

    Published in Dermatitis (01-05-2009)
    “…The North American Contact Dermatitis Group (NACDG) tests patients who have suspected allergic contact dermatitis with a broad series of screening allergens,…”
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    Journal Article
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    Formaldehyde and formaldehyde releasers: How much avoidance of cross-reacting agents is required? by Herbert, Courtney, Rietschel, Robert L.

    Published in Contact dermatitis (01-06-2004)
    “…We investigated whether or not individuals who are allergic to formaldehyde and various formaldehyde‐releasing preservatives must avoid exposure to another…”
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    Journal Article
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    North American Contact Dermatitis Group patch-test results, 2001-2002 study period by Pratt, Melanie D, Belsito, Donald V, DeLeo, Vincent A, Fowler, Jr, Joseph F, Fransway, Anthony F, Maibach, Howard I, Marks, James G, Mathias, C G Toby, Rietschel, Robert L, Sasseville, Denis, Sherertz, Elizabeth F, Storrs, Frances J, Taylor, James S, Zug, Kathryn

    Published in Dermatitis (01-12-2004)
    “…Allergic contact dermatitis is a significant cause of cutaneous disease affecting many individuals in the home and at the workplace. Patch testing is the most…”
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    Journal Article
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    Prevention of poison ivy and poison oak allergic contact dermatitis by quaternium-18 bentonite by Marks, James G, Fowler, Joseph F, Sherertz, Elizabeth F, Rietschel, Robert L

    “…Background: Poison ivy and poison oak are the most common causes of allergic contact dermatitis in North America. Objective: We investigated whether a new…”
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    Journal Article
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    North American Contact Dermatitis Group patch-test results, 2003-2004 study period by Warshaw, Erin M, Belsito, Donald V, DeLeo, Vincent A, Fowler, Jr, Joseph F, Maibach, Howard I, Marks, James G, Toby Mathias, C G, Pratt, Melanie D, Rietschel, Robert L, Sasseville, Denis, Storrs, Frances J, Taylor, James S, Zug, Kathryn A

    Published in Dermatitis (01-05-2008)
    “…Allergic contact dermatitis is a significant cause of both occupational and non-occupational skin disease. Patch testing is an important diagnostic tool for…”
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    Journal Article
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    Detection of nickel sensitivity has increased in North American patch-test patients by Rietschel, Robert L, Fowler, Joseph F, Warshaw, Erin M, Belsito, Donald, DeLeo, Vincent A, Maibach, Howard I, Marks, James G, Mathias, C G Toby, Pratt, Melanie, Sasseville, Denis, Storrs, Frances J, Taylor, James S, Zug, Kathryn A

    Published in Dermatitis (01-01-2008)
    “…Nickel allergy has been studied by contact dermatitis groups around the world, and the frequency of nickel sensitivity has been reported to be decreasing in…”
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    Journal Article
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    Clues to an accurate diagnosis of contact dermatitis by Rietschel, Robert L.

    Published in Dermatologic therapy (01-09-2004)
    “…An accurate diagnosis of allergic contact dermatitis can be achieved by a combination of historical, morphologic, and diagnostic steps. Clues in the history…”
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    Journal Article
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