Search Results - "Riege, S.P."

Comparing different approaches to characterization of focused X-ray laser beams by Chalupsky, J., Bohacek, P., Hajkova, V., Hau-Riege, S.P., Heimann, P.A., Juha, L., Krzywinski, J., Messerschmidt, M., Moeller, S.P., Nagler, B., Rowen, M., Schlotter, W.F., Swiggers, M.L., Turner, J.J.

“…X-ray lasers represent a powerful tool to explore matter under extreme conditions. A rigorous characterization of their output parameters is, therefore, of…”
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A hierarchical reliability analysis for circuit design evaluation by Riege, S.P., Thompson, C.V., Clement, J.J.

“…We suggest a computationally efficient and flexible strategy for assessment of reliability of integrated circuits. The concept of hierarchical reliability…”
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Far-infrared spectroscopy of quantum wires and dots, breaking Kohn’s theorem by Heitmann, D., Bollweg, K., Gudmundsson, V., Kurth, T., Riege, S.P.

“…We review far-infrared experiments on quantum wires and dots. In particular, we show that with tailored deviations from a parabolic external lateral…”
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Methodology for electromigration critical threshold design rule evaluation by Clement, J.J., Riege, S.P., Cvijetic, R., Thompson, C.V.

“…We propose a methodology using nodal analysis techniques compatible with existing computer-aided design (CAD) tools for implementing critical threshold design…”
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Femtosecond time-delay X-ray holography by Bogan, Michael J, Chapman, Henry N, London, Richard A, Woods, Bruce W, Bergh, Magnus, Caleman, Carl, Szöke, Abraham, Möller, Thomas, Treusch, Rolf, Bajt, Saša, Benner, W. Henry, Frank, Matthias, Plönjes, Elke, Huldt, Gösta, Marchesini, Stefano, Shapiro, David A, Hajdu, Janos, Boutet, Sébastien, Burmeister, Florian, Barty, Anton, Bostedt, Christoph, Kuhlmann, Marion, Seibert, M. Marvin, Spiller, Eberhard, Hau-Riege, Stefan P, Rohner, Urs

“…Extremely intense and ultrafast X-ray pulses from free-electron lasers offer unique opportunities to study fundamental aspects of complex transient phenomena…”
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Synchrotron topographic evaluation of strain around craters generated by irradiation with X-ray pulses from free electron laser with different intensities by Wierzchowski, W., Wieteska, K., Sobierajski, R., Klinger, D., Pełka, J., Żymierska, D., Paulmann, C., Hau-Riege, S.P., London, R.A., Graf, A., Burian, T., Chalupský, J., Gaudin, J., Krzywinski, J., Moeller, S., Messerschmidt, M., Bozek, J., Bostedt, Ch

“…The silicon sample irradiated with femtosecond soft X-ray pulses at the Linac Coherent Light Source has been studied with several synchrotron X-ray diffraction…”
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Subnanometer-scale measurements fo the interaction of ultrafastsoft x-ray free-electron-laser pulses with matter by Hau-Riege, S.P., Chapman, H.N., Krzywinski, J., Sobierajski, R., Bajt, S., London, R.A., Bergh, M., Caleman, C., Nietubyc, R., Juha, L., Kuba, J., Spiller, E., Baker, S., Bionta, R., Tinten, K.S., Stojanovic,N., Kjornrattanawanich, B., Gullikson, E., Plonjes, E., Toleikis, S., Tschentscher, T.

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Simulation of the influence of particles on grain structure evolution in two-dimensional systems and thin films by Riege, S.P., Thompson, C.V., Frost, H.J.

“…A two-dimensional front-tracking simulation of grain growth has been extended to treat the effects of particles on the evolution of grain structures during…”
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Prospects for single-particle imaging at XFELs by Chapman, H.N., Hau-Riege, S.P., London, R.A., Marchesini, S., Noy, A., Szoke, A., Szoke, H., Ingerman, E., Hajdu, J., Huldt, G., Howells, M.R., He, H., Spence, J.C.H., Weierstall, U.

“…X-ray free-electron lasers will produce pulses of X-rays that are 10 orders of magnitude brighter than today's undulator sources at synchrotrons. This may…”
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Single-Shot Femtosecond X-ray Diffraction from Randomly Oriented Ellipsoidal Nanoparticles by Bogan, M.J., /SLAC, Boutet, S., Barty, A., /LLNL, Livermore /DESY, Benner, W.H., Frank, M., /LLNL, Livermore, Lomb, L., Shoeman, R., /Heidelberg, Max Planck Inst. Med. Res. /CFEL, Hamburg, Starodub, D., Seibert, M.M., /Uppsala U., Hau-Riege, S.P., Woods, B., Decorwin-Martin, P., Bajt, S., /DESY, Schulz, J., Rohner, U., /LLNL, Livermore /Unlisted, CH, Iwan, B., Timneanu, N., Marchesini, S., /LBL, Berkeley, Schlichting, I., Hajdu, J., Chapman, H.N., /DESY /Hamburg U., Inst. Theor. Phys. II

“…Coherent diffractive imaging of single particles using the single-shot 'diffract and destroy' approach with an x-ray free electron laser (FEL) was recently…”
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Contrasting failure characteristics of different levels of Cu dual-damascene metallization by Gan, C.L., Wei, F., Thompson, C.V., Pey, K.L., Choi, W.K., Hau-Riege, S.P., Yu, B.

“…Currently, several kilometers of interconnects are used to construct a state-of-the-art Si-based integrated circuit, which has up to 8 levels of metallization…”
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