Search Results - "Remennyi, M.A"

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  1. 1

    Low frequency noise in P-InAsSbP/n-InAs infrared light emitting diode-photodiode pairs by Dyakonova, N., Karandashev, S.A., Levinshtein, M.E., Matveev, B.A., Remennyi, M.A., Usikova, A.A.

    Published in Infrared physics & technology (01-09-2021)
    “…Low frequency noise in P-InAsSbP/n-InAs infrared light emitting diode- photodiode pairs is investigated for the first time at 300 K. It is shown that…”
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    Journal Article
  2. 2

    Low frequency noise in p-InAsSbP/n-InAs/n-InAsSbP and p-InAsSbP/n-InAsSbP mid-IR light emitting diodes by Dyakonova, N., Karandashev, S.A., Levinshtein, M.E., Matveev, B.A., Remennyi, M.A.

    Published in Infrared physics & technology (01-09-2022)
    “…•In InAs- and InAsSbP-based Light Emitting Diodes, the amplitude of the optical output 1/f noise is less than the amplitude of the reverse bias current noise…”
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    Journal Article
  3. 3

    Low frequency noise in double heterostructure P-InAsSbP/n-InAs mid-IR photodiodes at cryogenic temperature: Photovoltaic mode and forward bias by Dyakonova, N., Karandashev, S.A., Levinshtein, M.E., Matveev, B.A., Remennyi, M.A.

    Published in Infrared physics & technology (01-12-2020)
    “…Low frequency photocurrent noise, as well as the forward current noise are studied for the first time in mid-infrared InAsSbP/InAs double heterostructure…”
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    Journal Article
  4. 4

    InAsSbP Photodiodes for 2.6-2.8-[micro]m Wavelengths by Il'inskaya, N.D, Karandashev, S.A, Lavrov, A.A, Matveev, B.A, Remennyi, M.A, Stus, N.M, Usikova, A.A

    Published in Technical physics (01-02-2018)
    “…Research data for photovoltaic, I-V and C-V characteristics of InAsSbP/InAs heterostructure photodiodes that operate at room temperature in the wavelength…”
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    Journal Article
  5. 5

    P-InAsSbP/p-InAs0.88Sb0.12/n-InAs0.88Sb0.12/n+-InAs PDs with a smooth p-n junction by Il'inskaya, N.D., Karandashev, S.A., Lavrov, A.A., Matveev, B.A., Remennyi, M.A., Stus', N.M., Usikova, A.A.

    Published in Infrared physics & technology (01-01-2018)
    “…•Linear impurity distribution near the p-n junction.•Low unit area capacity (Co/A)77 K = 4.3 × 10−8 F × cm−2).•D4.7μm,300K∗ as high as 6.5 × 108 Jones…”
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  6. 6
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    InAsSbP/InAs0.9Sb0.1/InAs DH photodiodes (λ0.1=5.2μm, 300K) operating in the 77–353К temperature range by Brunkov, P.N., Il’inskaya, N.D., Karandashev, S.A., Lavrov, A.A., Matveev, B.A., Remennyi, M.A., Stus’, N.M., Usikova, A.A.

    Published in Infrared physics & technology (01-11-2015)
    “…Double heterostructure back-side illuminated photodiodes with a 10-μm thick InAs0.9Sb0.1 active layer have been fabricated, studied and characterized in the…”
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    Journal Article
  8. 8
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    Photodiode 1 x 64 linear array based on a double p-InAsSbP/n-In[As.sub.0.92][Sb.sub.0.08]/[n.sup.+]-InAs heterostructure by Il'inskaya, N.D, Karandashev, S.A, Karpukhina, N.G, Lavrov, A.A, Matveev, B.A, Remennyi, M.A, Stus, N.M, Usikova, A.A

    Published in Semiconductors (Woodbury, N.Y.) (01-05-2016)
    “…The results of studies of the current-voltage characteristics and of the photoelectric and luminescence properties of a monolithic diode 1 x 64 linear array…”
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    Journal Article
  10. 10

    P-InAsSbP/n-InAs single heterostructure back-side illuminated 8×8 photodiode array by Brunkov, P.N., Il’inskaya, N.D., Karandashev, S.A., Lavrov, A.A., Matveev, B.A., Remennyi, M.A., Stus’, N.M., Usikova, A.A.

    Published in Infrared physics & technology (01-09-2016)
    “…•BLIP regime starting from 190K at 3μm.•Capacitance as small as 1.3×10−7Fcm−2, 80K.•Good uniformity of diode parameters in 8×8 PD matrix…”
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    Journal Article
  11. 11

    Low dark current P-InAsSbP/n-InAs/N-InAsSbP/n+-InAs double heterostructure back-side illuminated photodiodes by Brunkov, P.N., Il’inskaya, N.D., Karandashev, S.A., Karpukhina, N.G., Lavrov, A.A., Matveev, B.A., Remennyi, M.A., Stus’, N.M., Usikova, A.A.

    Published in Infrared physics & technology (01-05-2016)
    “…•Lowest capacitance of InAs heterojunction PD.•Fast response.•High detectivity in the 3μm range.•BLIP operation at 150K at 3μm.•Flip-chip design…”
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    Journal Article
  12. 12

    P-InAsSbP/[n.sup.0]-InAs/[n.sup.+]-InAs photodiodes for operation at moderate cooling by Brunkov, P.N, Il'inskaya, N.D, Karandashev, S.A, Latnikova, N.M, Lavrov, A.A, Matveev, B.A, Petrov, A.S, Remennyi, M.A, Sevostyanov, E.N, Stus, N.M

    Published in Semiconductors (Woodbury, N.Y.) (01-10-2014)
    “…InAs single hetero structure photodiodes were considered as alternatives to cooled CdHgTe-based detectors sensitive to radiation around 3 pm spectral region in…”
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    Journal Article
  13. 13

    Nonuniformity in the spatial distribution of negative luminescence in InAsSb by Karandashev, S.A, Matveev, B.A, Mzhelskii, I.V, Polovinkin, V.G, Remennyi, M.A, Rybalchenko, A. Yu, Stus, N.M

    Published in Semiconductors (Woodbury, N.Y.) (01-02-2012)
    “…The spatial nonuniformity of negative luminescence and current crowding in InAsSb(P) mid-IR photodiodes is analyzed in relation to the applied voltage and…”
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    Journal Article
  14. 14

    Current-voltage characteristics and photocurrent collection in radially symmetric front-surface-illuminated InAsSb(P) photodiodes by Karandashev, S. A., Matveev, B. A., Ratushnyi, V. I., Remennyi, M. A., Rybal’chenko, A. Yu, Stus’, N. M.

    Published in Technical physics (01-11-2014)
    “…The I–V characteristics of front-surface-illuminated InAsSb(P) photodiodes are simulated in terms of a simple model that takes into account the radial…”
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    Journal Article
  15. 15

    Cooled P-InAsSbP/n-InAs/N-InAsSbP double heterostructure photodiodes by Brunkov, P.N., Il'inskaya, N.D., Karandashev, S.A., Lavrov, A.A., Matveev, B.A., Remennyi, M.A., Stus', N.M., Usikova, A.A.

    Published in Infrared physics & technology (01-05-2014)
    “…•We tested for the first time InAs double heterostructure photodiodes at low temperatures.•InAs DH photodiodes exhibited superior performance compared to any…”
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    Journal Article
  16. 16

    Low voltage episide down bonded mid-IR diode optopairs for gas sensing in the 3.3–4.3 μm spectral range by Remennyi, M.A., Zotova, N.V., Karandashev, S.A., Matveev, B.A., Stus’, N.M., Talalakin, G.N.

    Published in Sensors and actuators. B, Chemical (01-06-2003)
    “…We describe “flip chip bonded” In(Ga)As and InAsSb heterostructure photodiodes and light emitting diodes (LEDs) ( λ=3.3–4.3 μm) grown onto n-InAs substrate…”
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  17. 17

    InGaAsSb negative luminescent devices with built-in cavities emitting at [formula omitted] by Remennyi, M.A., Matveev, B.A., Zotova, N.V., Karandashev, S.A., M. Stus’, N., Talalakin, G.N.

    “…An As 2S 3 fiber coupled to an InGaAsSb photodiode was used to record the radiation distribution over the emitting surface in InGaAsSb episide-down-bonded…”
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    Journal Article
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