Search Results - "Reganaz, Lucas"

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    Investigation of resistance fluctuations in ReRAM: physical origin, temporal dependence and impact on memory reliability by Reganaz, L., Deleruyelle, D., Rafhay, Q., Minguet Lopez, J., Castellani, N., Nodin, J. F., Bricalli, A., Piccolboni, G., Molas, G., Andrieu, F.

    “…We investigate the impact of ReRAM resistance fluctuations in a 16kb memory array. ReRAM retention and read current fluctuations are the main factors limiting…”
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    Conference Proceeding
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