Search Results - "Rayas, Juan Antonio"

Application of speckle interferometry to the mechanical characterization of a biopolymer sample by Gómez-Méndez, Gustavo A, Martínez-García, Amalia, Antonio Rayas, Juan, Gaitán, Alexander

“…In this work, we present an optical and mechanical characterization of the behavior of an inhomogeneous biopolymer sample through the use of an in-plane…”
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LED source interferometer for microscopic fringe projection profilometry using a Gates’ interferometer configuration by Sánchez, José Rubén, Martínez-García, Amalia, Rayas, Juan Antonio, León-Rodríguez, Miguel

“…•A microscopic fringe projection profilometry system based on Gates' interferometer is introduced.•The proposed method uses a LED as a light source.•A…”
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Dynamic phase profile of phase objects based in the use of a quasi-common path interferometer by Serrano-García, David Ignacio, Toto-Arellano, Noel Ivan, Martínez-García, Amalia, Álvarez, Juan Antonio Rayas, Zurita, Gustavo Rodríguez

“…In this paper, we propose a quasi common-path interferometer based on a two beams configuration (TBC) using simultaneous phase shifting interferometry…”
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Measurement in-plane deformations in electronic speckle pattern interferometry using phase-shifting modulated by polarization by Gómez-Méndez, Gustavo A., Martínez-García, Amalia, Serrano-García, David I., Rayas-Álvarez, Juan Antonio, Pérez, Areli Montes, Islas-Islas, Juan M., Toto-Arellano, Noel Ivan

“…We propose to combine electronic speckle pattern interferometry with polarizing phase-shifting techniques to measure in-plane displacement fields. We present…”
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Measurement of In-Plane Strain with Shearography and Electronic Speckle Pattern Interferometry for Composite Materials by Martinez-Garcia, Amalia, Rayas-Alvarez, Juan-Antonio, Cordero, Raul

“…Experimental results obtained by applying both technique, Electronic Speckle Pattern Interferometry (ESPI) and Electronic Speckle Pattern Shearing…”
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Electronic speckle pattern interferometer design to get maximum sensitivity on the measurement of displacement vector fields by Martínez, Amalia, Rayas, Juan Antonio, Cordero, Raúl

“…In the present work, different geometries of interferometers with three divergent illumination beams are discussed. It is shown that the sensitivity components…”
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