Search Results - "Rath, Kunal"

International collaboration framework for the calculation of performance loss rates: Data quality, benchmarks, and trends (towards a uniform methodology) by Lindig, Sascha, Moser, David, Curran, Alan J., Rath, Kunal, Khalilnejad, Arash, French, Roger H., Herz, Magnus, Müller, Björn, Makrides, George, Georghiou, George, Livera, Andreas, Richter, Mauricio, Ascencio‐Vásquez, Julián, Iseghem, Mike, Meftah, Mohammed, Jordan, Dirk, Deline, Chris, Sark, Wilfried, Stein, Joshua S., Theristis, Marios, Meyers, Bennet, Baumgartner, Franz, Luo, Wei

“…The IEA PVPS Task 13 group, experts who focus on photovoltaic performance, operation, and reliability from several leading R&D centers, universities, and…”
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Evaluation of PV Module Packaging Strategies of Monofacial and Bifacial PERC Using Degradation Pathway Network Modeling by Venkat, Sameera Nalin, Liu, Jiqi, Yu, Xuanji, Wegmueller, Jakob, Rath, Kunal, Li, Xinjun, Jaubert, Jean-Nicolas, Braid, Jennifer L., French, Roger H., Bruckman, Laura S.

“…As the PV industry is rapidly expanding, it is important to thoroughly investigate the long-term impact of packaging strategies on the performance of PV…”
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PVplr: R Package Implementation of Multiple Filters and Algorithms for Time-series Performance Loss Rate Analysis by Curran, Alan J., Burleyson, Tyler L., Rath, Kunal, Xin, Arthur S., Lindig, Sascha, Moser, David, Stein, Joshua, Bruckman, Laura S., French, Roger H.

“…PVplr is an R package designed with the intent to offer a variety of options and side-by-side comparisons when modeling outdoor PV time-series data for…”
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Spatio-Temporal Modeling of Field Surveyed Backsheet Degradation by Wieser, Raymond J., Rath, Kunal, Moffitt, Stephanie L., Zabalza, Ruben, Boucher, Evan, Ayala, Silvana, Brown, Matthew, Gu, Xiaohong, Ji, Liang, O'Brien, Colleen, Hauser, Adam W., O'Brien, Greg S., French, Roger H., Kempe, Micheal D., Tracy, Jared, Choudhury, Kausik R., Gambogi, William J., Bruckman, Laura S., Boyce, Kenneth P.

“…Assessing photovoltaic module backsheet durability is critical to increasing module lifetime. Lab based accelerating testing has recently failed to predict…”
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