Search Results - "Ramakrishnan, V N"
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An Optimized Vertical GaN Parallel Split Gate Trench MOSFET Device Structure for Improved Switching Performance
Published in IEEE access (01-01-2023)“…This work proposes a vertical gallium nitride (GaN) parallel split gate trench MOSFET (PSGT-MOSFET) device architecture suitable for power conversion…”
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2
Performance Analysis of Germanium-Silicon Vertical Tunnel Field-Effect Transistors (Ge-Si-VTFETs) for Analog/RF Applications
Published in SILICON (01-11-2022)“…The performance analysis of Ge-Si-VTFETs for analog/RF applications has been studied in this article under various gate dielectric materials. In the proposed…”
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3
Investigation of Hetero Buried Oxide and Gate Dielectric PNPN Tunnel Field Effect Transistors
Published in SILICON (01-11-2021)“…This paper investigates a novel hetero dielectric buried oxide and gate dielectric based PNPN tunnel field effect transistor (HDB-HDG-PNPN-TFET) using 2-D…”
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4
Electrostatic characteristics of a high-k stacked gate-all-around heterojunction tunnel field-effect transistor using the superposition principle
Published in Journal of computational electronics (01-02-2022)“…We use the superposition method to model the electrostatic characteristics of a high- k stacked gate-all-around heterojunction tunneling field-effect…”
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5
Conductive Filament Variation of RRAM and Its Impact on Single Event Upset
Published in Transactions on electrical and electronic materials (01-06-2022)“…Resistive random-access memory (RRAM) is a non-charge-based two-terminal non-volatile memory device. It is a promising candidate for usage in high radiation…”
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6
Analytical modeling and quasi-static characterization of a lithium niobate (LiNbO3)-based metal–ferroelectric–metal–insulator–semiconductor (MFMIS) NCFET
Published in Journal of computational electronics (01-10-2023)“…Lowering power consumption has emerged as the primary goal as silicon circuits become more compact. Furthermore, the ultra-highly integrated circuit will…”
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7
Pressure Sensors Using Si/ZnO Heterojunction Diode
Published in SILICON (01-06-2022)“…In nanoregime, heterojunction diodes have efficient applications in design and fabrication of sensors. Heterojunction diodes are formed by fusing two…”
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Gate and drain SEU sensitivity of sub-20-nm FinFET- and Junctionless FinFET-based 6T-SRAM circuits by 3D TCAD simulation
Published in Journal of computational electronics (01-03-2017)“…Scaling of metal–oxide–semiconductor field-effect transistors (MOSFETs) to below a few tens of nanometer has failed to make significant improvements. FinFETs…”
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9
Radiation effects on memristor-based non-volatile SRAM cells
Published in Journal of computational electronics (01-03-2018)“…Memristors are a promising candidate for non-volatile memory elements. In this paper, we performed a radiation study on different memristor-based topological…”
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10
Influence of trap carriers in SiO2/HfO2 stacked dielectric cylindrical gate tunnel fet
Published in SILICON (01-06-2022)“…The influence of trap carriers at the Si-SiO 2 interface near the source channel junction is analysed in this paper. The drain current is computed using the…”
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Dual-chirality GAA-CNTFET-based SCPF-TCAM cell design for low power and high performance
Published in Journal of computational electronics (01-09-2019)“…Ternary content-addressable memory (TCAM) is a type of associative memory used in many applications for high-speed data searching. We present herein a…”
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12
Effects of Co-doping on the Transport Characteristics of Nanoscale n-type Silicon-on-Insulator Transistors
Published in 2020 IEEE Silicon Nanoelectronics Workshop (SNW) (01-06-2020)“…In conventional downscaled Si transistors, the role of discrete dopants in nano-channels becomes critical; uniform high doping is desirable. Even in such…”
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Conference Proceeding -
13
Effect of underlap and soft error performance in 30 nm FinFET-based 6T-SRAM cells with simultaneous and independent driven gates
Published in Journal of computational electronics (01-09-2013)“…The effect of Gate-Source/Drain underlap ( L un ) on soft error performance in 30 nm common double gate-FinFET (simultaneously driven gates) and independent…”
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14
Vertical GaN Split Gate Trench MOSFET with Improved High Frequency FOM
Published in 2020 IEEE 17th India Council International Conference (INDICON) (10-12-2020)“…Using TCAD Simulation, we present a systematic analysis and comparison of a new vertical GaN split gate trench MOSFET (SGT-MOSFET) with a conventional trench…”
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Conference Proceeding -
15
AC Gain analysis of Multi-stage Common Source Amplifier Using GAA-CNTFET
Published in 2020 5th International Conference on Devices, Circuits and Systems (ICDCS) (01-03-2020)“…Carbon Nanotube Field Effect Transistor (CNTFET) is cutting-edge technology where the demand for transistor scaling is increasing day by day industrially…”
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Conference Proceeding -
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A Novel Approach to Analyze the Resistance of the RRAM Based on the Conductive Nano Filament Length and Width Variation
Published in Transactions on electrical and electronic materials (01-10-2022)“…In the present as well as in the future world, the interaction of a person with the connected devices will be more. It has been predicted that these…”
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17
A Novel Approach to Analyze Current-Voltage Characteristics of Double Gated-Memristor
Published in 2018 4th International Conference on Devices, Circuits and Systems (ICDCS) (01-03-2018)“…Memristor is a nano-electronic device which relates charge and flux. It is an excellent candidate for emerging technologies. Memristor exits as either two- or…”
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Conference Proceeding -
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Vertical GaN Reverse Trench-Gate Power MOSFET and DC-DC Converter
Published in Transactions on electrical and electronic materials (01-06-2021)“…A vertical GaN reverse trench-gate power MOSFET (RT-MOSFET) device is proposed. This Vertical RT-MOSFET features the negative incline of broaden-trench…”
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A 2D Transconductance and Sub-threshold behavior model for triple material surrounding gate (TMSG) MOSFETs
Published in Microelectronics (01-12-2013)“…A 2D analytical model for transconductance, Sub-threshold current and Sub-threshold swing for Triple Material Surrounding Gate MOSFET (TMSG) is presented in…”
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Topological variation on sub-20 nm double-gate inversion and Junctionless-FinFET based 6T-SRAM circuits and its SEU radiation performance
Published in Microelectronics and reliability (01-03-2018)“…Introduction of new conduction mechanism called junctionless in MOSFETs takes us to another direction in device fabrication. Moving from inversion to…”
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