Search Results - "Rajoo, Ranjan"
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1
Modeling Stress in Silicon With TSVs and Its Effect on Mobility
Published in IEEE transactions on components, packaging, and manufacturing technology (2011) (01-09-2011)“…With the most popular electronic products being the slimmest ones with the highest functionality, the ability to thin, stack, and interconnect chips is…”
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2
A self-contained disposable cartridge microsystem for dengue viral ribonucleic acid extraction
Published in Sensors and actuators. B, Chemical (15-12-2011)“…A self-contained disposable polydimethylsiloxane (PDMS) cartridge was developed for the extraction of dengue viral ribonucleic acid (RNA) in solid phase. The…”
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3
Comparison of Mechanical Properties of Nickel-Palladium Plated and Tin-Plated Copper Leadframe Material at Elevated Temperatures
Published in 2022 IEEE 24th Electronics Packaging Technology Conference (EPTC) (07-12-2022)“…In this paper the mechanical properties of Copper-based (Cu) leadframe with Tin (Sn) and Nickel-Palladium (NiPd) finishing are compared by using…”
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Conference Proceeding -
4
Material characterization for nano wafer level packaging application
Published in Proceedings Electronic Components and Technology, 2005. ECTC '05 (2005)“…As the feature size of integrated circuit (IC) packages needs to be decreased significantly, computational methods in conjunction with experimental data have…”
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Conference Proceeding -
5
Application of Piezoresistive Stress Sensor in Wafer Bumping and Drop Impact Test of Embedded Ultrathin Device
Published in IEEE transactions on components, packaging, and manufacturing technology (2011) (01-06-2012)“…Though an understanding on the development of residual stresses in silicon device after chip level packaging processes has been investigated in previous…”
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6
Impact of High Temperature Storage for Prolonged Duration on Cu Leadframe Material Properties for Automotive Applications
Published in 2023 IEEE 25th Electronics Packaging Technology Conference (EPTC) (05-12-2023)“…Copper-based leadframe material with Tin (Sn) and Nickel-Palladium (NiPd) finishing are studied in this work. The samples are subjected to high temperature…”
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Conference Proceeding -
7
Dicing Blade Characterization Using Nano-indentation
Published in 2021 IEEE 23rd Electronics Packaging Technology Conference (EPTC) (07-12-2021)“…In this paper, the widely used nano-indentation technique is employed to characterize the mechanical properties of dicing blade. The dicing blade is a…”
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Conference Proceeding -
8
Process and Reliability of Embedded Micro-Wafer-Level Package (EMWLP) Using Low Cure Temperature Dielectric Material
Published in IEEE transactions on components, packaging, and manufacturing technology (2011) (01-01-2012)“…In this paper, we present the evaluation results of low cure temperature (less than 200°C) dielectric materials (LCTDMs) in terms of processability and…”
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9
Design and Development of Multi-Die Laterally Placed and Vertically Stacked Embedded Micro-Wafer-Level Packages
Published in IEEE transactions on components, packaging, and manufacturing technology (2011) (01-01-2011)“…Two embedded micro-wafer-level packages (EMWLP) with 1) laterally placed and 2) vertically stacked thin dies are designed and developed. Three-dimensional…”
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10
Low-Stress Bond Pad Design for Low-Temperature Solder Interconnections on Through-Silicon Vias (TSVs)
Published in IEEE transactions on components, packaging, and manufacturing technology (2011) (01-04-2011)“…Low-temperature bonds are thin intermetallic (IMC) bonds that are formed between devices when plated layers of different metals on each side of the component…”
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11
Development of process modeling methodology for flip chip on flex interconnections with non-conductive adhesives
Published in Microelectronics and reliability (01-07-2005)“…This paper presents a comprehensive methodology to model the assembly process of flip chip on flex interconnections with non-conductive adhesives (NCAs). The…”
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12
Moisture characteristics of wafer level compression molding compounds
Published in 2011 IEEE 13th Electronics Packaging Technology Conference (01-12-2011)“…This paper presents moisture characteristics of 10 wafer level compression molding compounds manufactured by 6 leading manufacturers. Moisture absorption test…”
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Conference Proceeding -
13
Swelling and time-dependent subcritical debonding of underfill during temperature-humidity aging of flip chip packages
Published in IEEE transactions on components and packaging technologies (01-12-2005)“…Stress corrosion cracking and the associated time-dependent subcritical debonding of the underfill-die interface is believed to be responsible for a large…”
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Journal Article -
14
Enabling fine pitch Cu & Ag alloy wire bond assessment for 28nm ultra low-k structure
Published in 2014 IEEE 64th Electronic Components and Technology Conference (ECTC) (01-05-2014)“…The use of copper wire in IC packaging has been growing steadily driven by cost effectiveness. However, there are concerns and issues that prevent or delay…”
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Conference Proceeding -
15
Design and fabrication of embedded passives on thin flexible substrates and reliability evaluation of passives performance
Published in 2010 12th Electronics Packaging Technology Conference (01-12-2010)“…Recent trends favour the widespread adoption of RFID technology for supply chain and retail applications. To be economically viable, the tags have to be…”
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Conference Proceeding -
16
Study on low-cost QFN packages for high-frequency applications
Published in 2012 IEEE 14th Electronics Packaging Technology Conference (EPTC) (01-12-2012)“…Quad flat no-lead (QFN) packages have found wide applications in RF and high-speed digital systems. The purpose of this paper is to study high-frequency…”
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Conference Proceeding -
17
Design and reliability analysis of pyramidal shape 3-layer stacked TSV die package
Published in 2011 IEEE 61st Electronic Components and Technology Conference (ECTC) (01-05-2011)“…In this work, the reliability of a pyramidal shape 3-layer stacked TSV die package has been studied by experiments and finite element analysis (FEA). The…”
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Conference Proceeding -
18
Embedded wafer level packages with laterally placed and vertically stacked thin dies
Published in 2009 59th Electronic Components and Technology Conference (01-05-2009)“…Two embedded micro wafer level packages (EMWLP) with (1) laterally placed and (2) vertically stacked thin dies are designed and developed. 3D stacking of thin…”
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Conference Proceeding -
19
A low stress bond pad design optimization of low temperature solder interconnections on TSVs for MEMS applications
Published in 2011 IEEE International 3D Systems Integration Conference (3DIC), 2011 IEEE International (01-01-2012)“…In new applications (such as MEMS, bio-MEMS), vertical integration requires a low processing temperature below 200°C to bond these devices without degrading…”
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Conference Proceeding -
20
Design and Development of Fine Pitch Copper/Low-K Wafer Level Package
Published in IEEE transactions on advanced packaging (01-05-2010)“…Copper (Cu)/low-dielectric constant (K) structures are desired choices for advanced integrated circuits (ICs) as the IC technology moving towards fine pitch,…”
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Journal Article