Search Results - "RHIGER, D. R"

High-Performance M/LWIR Dual-Band HgCdTe/Si Focal-Plane Arrays by Vilela, M. F., Olsson, K. R., Norton, E. M., Peterson, J. M., Rybnicek, K., Rhiger, D. R., Fulk, C. W., Bangs, J. W., Lofgreen, D. D., Johnson, S. M.

“…Mercury cadmium telluride (HgCdTe) grown on large-area silicon (Si) substrates allows for larger array formats and potentially reduced focal-plane array (FPA)…”
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Electron Transport in InAsSb-Based nBn Photodetector Structures by Umana-Membreno, G. A., Klein, B., Smith, E. P. G., Antoszewski, J., Plis, E., Johnson, S. M., Krishna, S., Rhiger, D. R., Faraone, L.

“…Magnetic-field-dependent Hall-effect measurements and high-resolution mobility spectrum analysis have been employed to determine electronic transport…”
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Infrared absorption behavior in CdZnTe substrates by SEN, S, RHIGER, D. R, CURTIS, C. R, KALISHER, M. H, HETTICH, H. L, CURRIE, M. C

“…Infrared (IR) optical transmission measurements of polished CdZnTe wafers can provide useful information about excess impurities, stoichiometry, and…”
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Wafer bonding of (211) Cd0.96Zn0.04Te on (001) silicon by MICLAUS, C, MALOUF, G, JOHNSON, S. M, RHIGER, D. R, GOORSKY, M. S

“…We have successfully bonded (211) cadmium zinc telluride (CZT) substrates onto (001) Si substrates for subsequent epitaxial-layer deposition of mercury cadmium…”
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Critical thickness in the HgCdTe/CdZnTe system by Berding, M A, Nix, W D, Rhiger, D R, Sen, S, Sher, A

“…The critical thickness of HgCdTe films on CdZnTe substrates shows that a very tight control of the substrate composition is needed to produce dislocation-free…”
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Reduction of CdZnTe substrate defects and relation to epitaxial HgCdTe quality by Sen, S, Liang, C S, Rhiger, D R, Stannard, J E, Arlinghaus, H F

“…We have conducted annealing experiments on CdZnTe wafers to restore stoichiometry, eliminate or reduce second-phase (Cd or Te) inclusions, and investigate…”
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High operating temperature interband cascade midwave infrared detector based on type-II InAs/GaSb strained layer superlattice by Gautam, Nutan, Myers, S., Barve, A. V., Klein, Brianna, Smith, E. P., Rhiger, D. R., Dawson, L. R., Krishna, S.

“…We report on an interband cascade mid-wave infrared (MWIR) detector based on type-II InAs/GaSb/AlSb strained layer superlattices (T2SL). The reported device…”
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HgCdTe/CdZnTe P-I-N high-energy photon detectors by Hamilton, W J, Rhiger, D R, Sen, S, Kalisher, M H

“…Classical solid-state detection of x-ray and gamma-ray radiation consists of a high voltage applied between two metallic contacts sandwiching a high…”
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Very high resolution detection of gamma radiation at room-temperature using p-i-n detectors of CdZnTe and HgCdTe by Hamilton, W.J., Rhiger, D.R., Sen, S., Kalisher, M.H., James, K., Reid, C.P., Gerrish, V., Baccash, C.O.

“…High-energy photon detectors have been constructed by engineering and fabricating p-i-n diode structures consisting of bulk CdZnTe and epitaxial HgCdTe. The…”
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Effect of dislocations on the electrical and optical properties of long‐wavelength infrared HgCdTe photovoltaic detectors by Johnson, S. M., Rhiger, D. R., Rosbeck, J. P., Peterson, J. M., Taylor, S. M., Boyd, M. E.

“…The quantitative effects of dislocations on the electrical and optical properties of long‐wavelength infrared (LWIR) HgCdTe photovoltaic detectors was…”
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Barrier Engineered Infrared Photodetectors Based on Type-II InAs/GaSb Strained Layer Superlattices by Gautam, N., Myers, S., Barve, A. V., Klein, B., Smith, E. P., Rhiger, D. R., Ha Sul Kim, Zhao-Bing Tian, Krishna, S.

“…We present the design, growth, fabrication, and characterization of unipolar barrier photodiodes, pBiBn, based on type-II InAs/GaSb superlattice for midwave…”
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Performance Comparison of Long-Wavelength Infrared Type II Superlattice Devices with HgCdTe by Rhiger, David R.

“…The InAs/GaSb family of type II superlattices (T2SL) is the only known infrared (IR) detector material having a theoretically predicted higher performance than…”
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Low-energy electron-enhanced etching of HgCdTe by JAEHWA KIM, KOGA, T. S, GILLIS, H. P, GOORSKY, Mark S, GARWOOD, Gerald A, VARESI, John B, RHIGER, David R, JOHNSON, Scott M

“…Low-energy electron-enhanced etching (LE4) is applied to HgCdTe to eliminate ion-induced surface damage. First, LE4 results for patterned samples are…”
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Strain relief in epitaxial HgCdTe by growth on a reticulated substrate by Rhiger, David R, Sen, Sanghamitra, Gordon, Eli E

“…In nearly all cases when an epitaxial layer of HgCdTe is grown on a CdZnTe substrate, there will be a finite lattice mismatch due to the lack of precise…”
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Extraction of mobile impurities from CdZnTe by Sen, Sanghamitra, Rhiger, David R, Curtis, Charles R, Norton, Paul R

“…To develop a process for removing impurities from the CdZnTe substrate, we have carried out experiments using a molten salt, KCN (potassium cyanide), for…”
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Progress in CdZnTe substrate producibility and critical drivers of IRFPA yield originating with CdZnTe substrates by Price, S. L., Hettich, H. L., Sen, S., Currie, M. C., Rhiger, D. R., Mc Lean, E. O.

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Use of ellipsometry to characterize the surface of HgCdTe by RHIGER, D. R

“…Author reviews applications of ellipsometry to HgCdTe and related materials. Methods and limitations of the analysis of nonabsorbing and absorbing single films…”
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CdZnTe substrate producibility and its impact on IRFPA yield by Sen, Sanghamitra, Hettich, Herbert L., Rhiger, David R., Price, Stephen L., Currie, Malcolm C., Ginn, Robert P., McLean, Eugene O.

“…The need for cost effective production of HgCdTe infrared detectors and focal plane assemblies has led to increased attention to the availability of high…”
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Surface characterization of Hg0.7Cd0.3Te native oxides by Wager, J. F., Rhiger, D. R.

“…Ultraviolet photoelectron spectroscopy (UPS), x‐ray photoelectron spectroscopy (XPS), and electron energy loss spectroscopy (ELS) were used to characterize the…”
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Wafer Bonding of (211) Cd^sub 0.96^Zn^sub 0.04^Te on (001) Silicon by Miclaus, C, Malouf, G, Johnson, S M, Rhiger, D R, Goorsky, M S

“…We have successfully bonded (211) cadmium zinc telluride (CZT) substrates onto (001) Si substrates for subsequent epitaxial-layer deposition of mercury cadmium…”
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