Search Results - "Quittard, Olivier"

ESD robust high-voltage active clamps by Notermans, Guido, Quittard, Olivier, Heringa, Anco, Mrčarica, Željko, Blanc, Fabrice, Zwol, Hans van, Smedes, Theo, Keller, Thomas, Jong, Peter de

“…Using circuit simulation extended by a proper failure criterion, the HBM and TLP robustness of high-voltage clamps can be accurately predicted without the need…”
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ESD robust high-voltage active clamps : Electrostatic Discharge Reliability by NOTERMANS, Guido, QUITTARD, Olivier, HERINGA, Anco, MRCARICA, Zeljko, BLANC, Fabrice, VAN ZWOL, Hans, SMEDES, Theo, KELLER, Thomas, DE JONG, Peter

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ESD protection for high-voltage CMOS technologies by Quittard, O., Mrcarica, Z., Blanc, F., Notermans, G., Smedes, T., van Zwol, H.

“…Two types of ESD protection for high-voltage CMOS technologies are presented. Both solutions can be readily ported between different HV CMOS process options…”
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Designing HV active clamps for HBM robustness by Notermans, G., Quittard, O., Heringa, A., Mrcarica, Z., Blanc, F., van Zwol, H., Smedes, T., Keller, T., de Jong, P.

“…Electrical measurements, physical damage analysis, and device simulation have proved that the drain junction breakdown voltage is the determining failure…”
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