Search Results - "QI-ZE RAN"

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    Electrical Resistance in Ion Beam Mixed Al/Si Thin Films by Zi, X-X, Ran, Q-Z, Liu, J-R, Guan, W-Y

    Published in Japanese Journal of Applied Physics (01-01-1987)
    “…Al/Si multilayer films were bombarded with energetic Ar ions at liquid helium temperature and the electrical resistances of the ion beam mixed samples were…”
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    Journal Article
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