Search Results - "Pude, M."

Passive and Active Reduction Techniques for On-Chip High-Frequency Digital Power Supply Noise by Bohannon, E., Urban, C., Pude, M., Nishi, Y., Gopalan, A., Mukund, P.R.

“…Signal integrity has become a major problem in digital IC design. One cause is device scaling that results in a sharp reduction of supply voltage, creating…”
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Amplifier gain enhancement with positive feedback by Pude, M, Mukund, P R, Singh, P, Paradis, K, Burleson, J

“…The use of positive feedback as a solution to maximum intrinsic gain degradation in scaled technologies is discussed. Criteria for increasing gain while…”
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Using positive feedback to overcome gmro limitations in scaled CMOS amplifier design by Pude, M., Mukund, P.R., Singh, P., Burleson, J.

“…The use of positive feedback as a solution to intrinsic gain degradation in scaled technologies is discussed. Criteria for increasing gain while keeping the…”
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An analytical propagation delay model with power supply noise effects by Pude, M., Washburn, C., Mukund, P.R., Abe, K., Nishi, Y.

“…This paper presents an analytical model for CMOS logic propagation delay which includes the effect of power supply noise. Using the nth power law model of…”
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Maximum intrinsic gain degradation in technology scaling by Pude, M., Macchietto, C., Singh, P., Burleson, J., Mukund, P.R.

“…Aggressive device scaling has begun to pose significant problems to the analog design community. For the most part, digital circuitry benefits from the effects…”
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