Search Results - "Puchala, Brian T"
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Collecting and analyzing microstructures in three dimensions: A fully automated approach
Published in JOM (1989) (01-10-2003)“…In the analysis that follows, a and b are the caliper diameters parallel to the x and y axes and c is the measured caliper diameter parallel to the z axis…”
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Journal Article -
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Modeling defect mediated dopant diffusion in silicon
Published 01-01-2009“…The current understanding of dopant diffusion in silicon comes from the synthesis of experimental and computational research. Dopant diffusion is mediated by…”
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Dissertation -
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Modeling defect mediated dopant diffusion in silicon
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Dissertation