Search Results - "Pu, Tanchao"

Unlabeled Far‐Field Deeply Subwavelength Topological Microscopy (DSTM) by Pu, Tanchao, Ou, Jun‐Yu, Savinov, Vassili, Yuan, Guanghui, Papasimakis, Nikitas, Zheludev, Nikolay I.

“…A nonintrusive far‐field optical microscopy resolving structures at the nanometer scale would revolutionize biomedicine and nanotechnology but is not yet…”
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Deeply sub-wavelength non-contact optical metrology of sub-wavelength objects by Rendón-Barraza, Carolina, Chan, Eng Aik, Yuan, Guanghui, Adamo, Giorgio, Pu, Tanchao, Zheludev, Nikolay I.

“…Microscopes and various forms of interferometers have been used for decades in optical metrology of objects that are typically larger than the wavelength of…”
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Counting and mapping of subwavelength nanoparticles from a single shot scattering pattern by Chan, Eng Aik, Rendón-Barraza, Carolina, Wang, Benquan, Pu, Tanchao, Ou, Jun-Yu, Wei, Hongxin, Adamo, Giorgio, An, Bo, Zheludev, Nikolay I.

“…Particle counting is of critical importance for nanotechnology, environmental monitoring, pharmaceutical, food and semiconductor industries. Here we introduce…”
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High-efficiency V-shaped phase gratings to suppress high order diffractions by Liu, Ziwei, Pu, Tanchao, Niu, Jiebin, Shi, Lina, Xie, Changqing

“…We propose a V-shaped phase grating to simultaneously improve the diffraction efficiency of the 1st order diffraction mode and suppression of high order modes…”
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Deep learning for the design and characterization of high efficiency self-focusing grating by Pu, Tanchao, Cao, Fulin, Liu, Ziwei, Xie, Changqing

“…We demonstrate that the deep learning algorithm can considerably simplify the design and characterization of high efficient self-focusing varied line-spaced…”
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Two-dimensional gratings of hexagonal holes for high order diffraction suppression by Liu, Ziwei, Shi, Lina, Pu, Tanchao, Li, Hailiang, Niu, Jiebin, Wang, Guanya, Xie, Changqing

“…We propose two-dimensional gratings comprised of a large number of identical and similarly oriented hexagonal holes for the high order diffraction suppression…”
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High order diffraction suppression by quasi-periodic two-dimensional gratings by Niu, Jiebin, Shi, Lina, Liu, Ziwei, Pu, Tanchao, Li, Hailiang, Wang, Guanya, Xie, Changqing

“…We propose quasi-periodic two-dimensional gratings comprised of a large number of circular holes for the high order diffraction suppression. By using…”
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Deeply Subwavelength Optical Imaging by Pu, Tanchao, Ou, Jun-Yu, Papasimakis, Nikitas, Zheludev, Nikolay I

“…We report the experimental demonstration of deeply subwavelength far-field optical imaging of unlabelled samples with resolution better than $\lambda/20$. We…”
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Deeply Sub-Wavelength Non-Contact Optical Metrology of Sub-Wavelength Objects by Rendon-Barraza, Carolina, Chan, Eng Aik, Yuan, Guanghui, Adamo, Giorgio, Pu, Tanchao, Zheludev, Nikolay I.

“…We report single-shot measuring nanoscale dimensions of randomly positioned objects by an artificial intelligence examination of their optical diffraction…”
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Optical Nano-Metrology of Sub-Wavelength Objects Enabled by Artificial Intelligence by Rendon-Barraza, Carolina, Chan, Eng Aik, Yuan, Guanghui, Adamo, Giorgio, Pu, Tanchao, Zheludev, Nikolay I.

“…We experimentally demonstrate that a linear dimension of a sub-wavelength nanoscale object can be measured with an accuracy better that λ/250 by a…”
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Optical Metrology of Sub-Wavelength Objects Enabled by Artificial Intelligence by Rendón-Barraza, Carolina, Chan, Eng Aik, Yuan, Guanghui, Adamo, Giorgio, Pu, Tanchao, Zheludev, Nikolay I

“…Microscopes and various forms of interferometers have been used for decades in optical metrology of objects that are typically larger than the wavelength of…”
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Phase-type zigzag grating for suppression high order diffraction by Liu, Ziwei, Pu, Tanchao, Shi, Lina, Xie, Changqing

“…We present a novel design of phase-type diffraction grating for spectrum measurement from soft x-ray to far infrared. The 0, 2n, 3n order diffractions can be…”
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Deeply Subwavelength Topological Microscopy by Pu, Tanchao, Ou, Jun-Yu, Yuan, Guanghui, Rogers, Edward, Papasimakis, Nikitas, Smith, Peter J., Zheludev, Nikolay I.

“…We demonstrate experimentally label-free far-field imaging of subwavelength objects at resolution greater than λ/20, exceeding the diffraction limit by an…”
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Deeply Subwavelength Topological Microscopy by Pu, Tanchao, Ou, Jun-Yu, Yuan, Guanghui, Rogers, Edward, Papasimakis, Nikitas, Smith, P. J., Zheludev, Nikolay I.

“…We demonstrate experimentally imaging resolution exceeding λ/20 by a new far-field and label-free approach based on illumination with topologically structured…”
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Deep Subwavelength Singularity Imaging beyond λ/100 by Pu, Tanchao, Savinov, Vassili, Yuan, Guang Hui, Ou, Jun-Yu, Papasimakis, Nikitas, Zheludev, Nikolay I.

“…We introduce a new far-field and label-free imaging paradigm based on combining singularity illumination with artificial-intelligence enabling reconstruction…”
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