Search Results - "Poulter, M.W."

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  1. 1

    Suppression of hot-carrier effects in submicrometer surface-channel PMOSFETs by Brassington, M.P., Poulter, M.W., El-Diwany, M.

    Published in IEEE transactions on electron devices (01-07-1988)
    “…Hot-carrier-induced degradation in surface-channel (p-type polysilicon gate) PMOSFETs is investigated. Hot-electron-induced punchthrough is found to limit the…”
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    Journal Article
  2. 2

    Use of the polysilicon gate layer for local interconnect in a CMOS technology incorporating LDD structures by El-Diwany, M.H., Brassington, M.P., Tuntasood, P., Razouk, R.R., Poulter, M.W.

    Published in IEEE transactions on electron devices (01-09-1988)
    “…In conventional single-level polysilicon technologies, the polysilicon gate layer can be used as an interconnect layer through buried contacts between…”
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    Journal Article
  3. 3

    Organo-metallic Langmuir-Blodgett multilayers: pyroelectric and dielectric properties by Poulter, M.W., Richardson, T., Roberts, G.G., Smallridge, A., Davies, S.G.

    “…Attempts were made to increase the pyroelectric coefficient of a novel class of organo-metallic Langmuir-Blodgett multilayers by increasing the packing density…”
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    Conference Proceeding