Search Results - "Potard, Pascale"
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Moisture Influence on Reliability and Electrical Characteristics of SiOC:H Low-k Dielectric Material
Published in 2019 IEEE International Integrated Reliability Workshop (IIRW) (01-10-2019)“…This paper presents an in depth study of the moisture influence on reliability and electrical characteristics of SiOC:H low-κ dielectric material. Firstly,…”
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Conference Proceeding -
2
Probing impact on pad moisture tightness: A challenge for pad size reduction
Published in 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) (01-03-2019)“…This paper underlines the damages induced by probing on narrow pads reliability of specifically designed test structures placed on dicing streets and indicates…”
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Conference Proceeding