Search Results - "Poivey, C.F."

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  1. 1

    Compendium of Recent Single Event Effects Results for Candidate Spacecraft Electronics for NASA by O'Bryan, M.V., LaBel, K.A., Buchner, S.P., Ladbury, R.L., Poivey, C.F., Oldham, T.R., Campola, M.J., Carts, M.A., Berg, M.D., Sanders, A.B., Mackey, S.R.

    Published in 2008 IEEE Radiation Effects Data Workshop (01-07-2008)
    “…We present the results of single event effects testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test…”
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    Conference Proceeding
  2. 2

    Compendium of Recent Total Ionizing Dose Results for Candidate Spacecraft Electronics for NASA by Cochran, D.J., Buchner, S.P., Sanders, A.B., LaBel, K.A., Carts, M.A., Poivey, C.F., Oldham, T.R., Ladbury, R.L., O'Bryan, M.V., Mackey, S.R.

    Published in 2008 IEEE Radiation Effects Data Workshop (01-07-2008)
    “…Radiation effects testing on a variety of candidate spacecraft electronics to total ionizing dose is studied. Devices tested include digital, analog, mixed…”
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    Conference Proceeding
  3. 3

    Compendium of Current Single Event Effects Results for Candidate Spacecraft Electronics for NASA by O'Bryan, M.V., Poivey, C.F., LaBel, K.A., Buchner, S.P., Ladbury, R.L., Oldham, T.R., Howard, J.W., Sanders, A.B., Berg, M.D., Titus, J.L.

    Published in 2007 IEEE Radiation Effects Data Workshop (01-07-2007)
    “…Sensitivity of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects is presented. Devices tested include digital,…”
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    Conference Proceeding
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