Search Results - "Poikela, Tuomas"

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    Extending a 65nm CMOS process design kit for high total ionizing dose effects by Nikolaou, Aristeidis, Bucher, Matthias, Makris, Nikos, Papadopoulou, Alexia, Chevas, Loukas, Borghello, Giulio, Koch, Henri D., Kloukinas, Kostas, Poikela, Tuomas S., Faccio, Federico

    “…Standard CMOS Process Design Kits (PDKs) do not address degradation the technology incurs when exposed to high Total Ionizing Dose (TID). Front-end electronics…”
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    Conference Proceeding
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