Search Results - "Piquette, E."
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1
The Effect of Contact Resistance on Short Wavelength Infrared Focal Plane Array Noise
Published in Journal of electronic materials (01-10-2024)“…Contact resistance can play a significant role in the noise performance of short wavelength infrared (SWIR) focal plane detector arrays (FPAs), particularly…”
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Journal Article -
2
High-Operating Temperature HgCdTe: A Vision for the Near Future
Published in Journal of electronic materials (01-09-2016)“…We review recent advances in the HgCdTe material quality and detector performance achieved at Teledyne using molecular beam epitaxy growth and the double-layer…”
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Journal Article -
3
Small-Pitch HgCdTe Photodetectors
Published in Journal of electronic materials (01-08-2014)“…If we can make wavelength-sized detectors, we approach the limit at which smaller detectors have no further advantage for imaging focal plane arrays with…”
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Journal Article Conference Proceeding -
4
Recent Progress in MBE Growth of CdTe and HgCdTe on (211)B GaAs Substrates
Published in Journal of electronic materials (01-10-2012)“…Alternate substrates for molecular beam epitaxy growth of HgCdTe including Si, Ge, and GaAs have been under development for more than a decade. MBE growth of…”
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Journal Article Conference Proceeding -
5
An assessment of multimodal imaging of subsurface text in mummy cartonnage using surrogate papyrus phantoms
Published in Heritage science (26-02-2018)“…Ancient Egyptian mummies were often covered with an outer casing, panels and masks made from cartonnage: a lightweight material made from linen, plaster, and…”
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6
The Effects of Microvoid Defects on MWIR HgCdTe-Based Diodes
Published in Journal of electronic materials (01-08-2011)“…The effects of microvoid defects on the performance of mid-wavelength infrared (MWIR) HgCdTe-based diodes were examined. Molecular beam epitaxy (MBE) was…”
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Journal Article Conference Proceeding -
7
High voltage (450 V) GaN Schottky rectifiers
Published in Applied physics letters (01-03-1999)“…We fabricated high standoff voltage (450 V) Schottky rectifiers on hydride vapor phase epitaxy grown GaN on sapphire substrate. Several Schottky device…”
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8
Minority carrier diffusion length and lifetime in GaN
Published in Applied physics letters (15-06-1998)“…Electron beam induced current measurements on planar Schottky diodes on undoped GaN grown by metalorganic chemical vapor deposition are reported. The minority…”
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9
Electron diffusion length and lifetime in p -type GaN
Published in Applied physics letters (30-11-1998)“…We report on electron beam induced current and current–voltage (I–V) measurements on Schottky diodes on p-type doped GaN layers grown by metal organic chemical…”
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10
Substrate-Removed HgCdTe-Based Focal-Plane Arrays for Short-Wavelength Infrared Astronomy
Published in Journal of electronic materials (01-09-2008)“…Removal of the CdZnTe substrate offers several performance benefits for near-infrared (NIR, 1.7 μ m) and short-wave infrared (SWIR, 2.5 μ m) focal-plane…”
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Journal Article Conference Proceeding -
11
Measurement of induced surface charges, contact potentials, and surface states in GaN by electric force microscopy
Published in Applied physics letters (07-06-1999)“…We have studied molecular beam epitaxy grown GaN films of both polarities using electric force microscopy to detect sub 1 μm regions of charge density…”
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Journal Article -
12
Status of LWIR HgCdTe-on-Silicon FPA Technology
Published in Journal of electronic materials (01-09-2008)“…The use of silicon as an alternative substrate to bulk CdZnTe for epitaxial growth of HgCdTe for infrared detector applications is attractive because of…”
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Journal Article Conference Proceeding -
13
Precise arsenic doping of HgCdTe by MBE and effects on compositional interdiffusion
Published in Journal of electronic materials (01-06-2006)“…Characterization data are presented for arsenic-doped Hg^sub 1-x^Cd^sub x^Te epilayers, grown on CdZnTe substrates by molecular beam epitaxy. Arsenic…”
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Conference Proceeding Journal Article -
14
The values of minority carrier diffusion lengths and lifetimes in GaN and their implications for bipolar devices
Published in Solid-state electronics (01-02-2000)“…The wide bandgap semiconductors GaN and AlGaN show promise as the high voltage standoff layers in high power heterostructure bipolar transistors and thyristors…”
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15
HgCdTe negative luminescence devices for cold shielding and other applications
Published in Journal of electronic materials (01-06-2006)“…Negative luminescence (NL) refers to the suppression of infrared blackbody emission, and hence an apparent temperature reduction, due to free carrier…”
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Conference Proceeding Journal Article -
16
Accurate measurement of composition, carrier concentration, and photoconductive lifetime in Hg1-xCdxTe grown by molecular beam epitaxy
Published in Journal of electronic materials (01-06-2006)“…Variable magnetic field Hall and transient photoconductance lifetime measurements were performed on a series of undoped, In-doped, and As-doped HgCdTe samples…”
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17
Optical-absorption model for molecular-beam epitaxy HgCdTe and application to infrared detector photoresponse
Published in Journal of electronic materials (01-06-2004)“…Accurate knowledge of the optical-absorption coefficient in HgCdTe is important for infrared (IR) detector design, production process (layer screening), and…”
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Conference Proceeding Journal Article -
18
MBE growth of HgCdTe epilayers with reduced visible defect densities: kinetics considerations and substrate limitations
Published in Journal of electronic materials (01-06-2001)“…A semi-empirical constraint to the thermodynamical model for growth of Hg1−xCdxTe (MCT) by molecular beam epitaxy is described. This constraint, derived by…”
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Conference Proceeding Journal Article -
19
Molecular beam epitaxy growth of high-quality arsenic-doped HgCdTe
Published in Journal of electronic materials (01-06-2004)“…We have initiated a joint effort to better elucidate the fundamental mechanisms underlying As-doping in molecular beam epitaxy (MBE)-grown HgCdTe. We have…”
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Conference Proceeding Journal Article -
20
MCT-on-silicon negative luminescence devices with high efficiency
Published in Journal of electronic materials (01-08-2007)“…We used an InSb radiometric thermal imager to characterize the performance of 1'' × 1'' negative luminescent (NL) arrays. The devices grown on both CdZnTe (two…”
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Conference Proceeding Journal Article