Search Results - "Piquette, E."

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  1. 1

    The Effect of Contact Resistance on Short Wavelength Infrared Focal Plane Array Noise by Piquette, E. C.

    Published in Journal of electronic materials (01-10-2024)
    “…Contact resistance can play a significant role in the noise performance of short wavelength infrared (SWIR) focal plane detector arrays (FPAs), particularly…”
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    Journal Article
  2. 2

    High-Operating Temperature HgCdTe: A Vision for the Near Future by Lee, D., Carmody, M., Piquette, E., Dreiske, P., Chen, A., Yulius, A., Edwall, D., Bhargava, S., Zandian, M., Tennant, W. E.

    Published in Journal of electronic materials (01-09-2016)
    “…We review recent advances in the HgCdTe material quality and detector performance achieved at Teledyne using molecular beam epitaxy growth and the double-layer…”
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    Journal Article
  3. 3

    Small-Pitch HgCdTe Photodetectors by Tennant, W. E., Gulbransen, D. J., Roll, A., Carmody, M., Edwall, D., Julius, A., Dreiske, P., Chen, A., McLevige, W., Freeman, S., Lee, D., Cooper, D. E., Piquette, E.

    Published in Journal of electronic materials (01-08-2014)
    “…If we can make wavelength-sized detectors, we approach the limit at which smaller detectors have no further advantage for imaging focal plane arrays with…”
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    Journal Article Conference Proceeding
  4. 4

    Recent Progress in MBE Growth of CdTe and HgCdTe on (211)B GaAs Substrates by Carmody, M., Yulius, A., Edwall, D., Lee, D., Piquette, E., Jacobs, R., Benson, D., Stoltz, A., Markunas, J., Almeida, A., Arias, J.

    Published in Journal of electronic materials (01-10-2012)
    “…Alternate substrates for molecular beam epitaxy growth of HgCdTe including Si, Ge, and GaAs have been under development for more than a decade. MBE growth of…”
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    Journal Article Conference Proceeding
  5. 5
  6. 6

    The Effects of Microvoid Defects on MWIR HgCdTe-Based Diodes by Billman, C. A., Almeida, L. A., Smith, P., Arias, J. M., Chen, A., Lee, D., Piquette, E. C.

    Published in Journal of electronic materials (01-08-2011)
    “…The effects of microvoid defects on the performance of mid-wavelength infrared (MWIR) HgCdTe-based diodes were examined. Molecular beam epitaxy (MBE) was…”
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    Journal Article Conference Proceeding
  7. 7

    High voltage (450 V) GaN Schottky rectifiers by Bandić, Z. Z., Bridger, P. M., Piquette, E. C., McGill, T. C., Vaudo, R. P., Phanse, V. M., Redwing, J. M.

    Published in Applied physics letters (01-03-1999)
    “…We fabricated high standoff voltage (450 V) Schottky rectifiers on hydride vapor phase epitaxy grown GaN on sapphire substrate. Several Schottky device…”
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    Journal Article
  8. 8

    Minority carrier diffusion length and lifetime in GaN by Bandić, Z. Z., Bridger, P. M., Piquette, E. C., McGill, T. C.

    Published in Applied physics letters (15-06-1998)
    “…Electron beam induced current measurements on planar Schottky diodes on undoped GaN grown by metalorganic chemical vapor deposition are reported. The minority…”
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    Journal Article
  9. 9

    Electron diffusion length and lifetime in p -type GaN by Bandić, Z. Z., Bridger, P. M., Piquette, E. C., McGill, T. C.

    Published in Applied physics letters (30-11-1998)
    “…We report on electron beam induced current and current–voltage (I–V) measurements on Schottky diodes on p-type doped GaN layers grown by metal organic chemical…”
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    Journal Article
  10. 10

    Substrate-Removed HgCdTe-Based Focal-Plane Arrays for Short-Wavelength Infrared Astronomy by Piquette, E.C., Edwall, D.D., Arnold, H., Chen, A., Auyeung, J.

    Published in Journal of electronic materials (01-09-2008)
    “…Removal of the CdZnTe substrate offers several performance benefits for near-infrared (NIR, 1.7  μ m) and short-wave infrared (SWIR, 2.5  μ m) focal-plane…”
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    Journal Article Conference Proceeding
  11. 11

    Measurement of induced surface charges, contact potentials, and surface states in GaN by electric force microscopy by Bridger, P. M., Bandić, Z. Z., Piquette, E. C., McGill, T. C.

    Published in Applied physics letters (07-06-1999)
    “…We have studied molecular beam epitaxy grown GaN films of both polarities using electric force microscopy to detect sub 1 μm regions of charge density…”
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    Journal Article
  12. 12

    Status of LWIR HgCdTe-on-Silicon FPA Technology by Carmody, M., Pasko, J.G., Edwall, D., Piquette, E., Kangas, M., Freeman, S., Arias, J., Jacobs, R., Mason, W., Stoltz, A., Chen, Y., Dhar, N.K.

    Published in Journal of electronic materials (01-09-2008)
    “…The use of silicon as an alternative substrate to bulk CdZnTe for epitaxial growth of HgCdTe for infrared detector applications is attractive because of…”
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    Journal Article Conference Proceeding
  13. 13

    Precise arsenic doping of HgCdTe by MBE and effects on compositional interdiffusion by PIQUETTE, E. C, EDWALL, D. D, LEE, D. L, ARIAS, J. M

    Published in Journal of electronic materials (01-06-2006)
    “…Characterization data are presented for arsenic-doped Hg^sub 1-x^Cd^sub x^Te epilayers, grown on CdZnTe substrates by molecular beam epitaxy. Arsenic…”
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    Conference Proceeding Journal Article
  14. 14

    The values of minority carrier diffusion lengths and lifetimes in GaN and their implications for bipolar devices by Bandić, Z.Z, Bridger, P.M, Piquette, E.C, McGill, T.C

    Published in Solid-state electronics (01-02-2000)
    “…The wide bandgap semiconductors GaN and AlGaN show promise as the high voltage standoff layers in high power heterostructure bipolar transistors and thyristors…”
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    Journal Article
  15. 15

    HgCdTe negative luminescence devices for cold shielding and other applications by LINDLE, J. R, BEWLEY, W. W, VURGAFTMAN, I, MEYER, J. R, JOHNSON, J. L, THOMAS, M. L, PIQUETTE, E. C, TENNANT, W. E, SMITH, E. P, JOHNSON, S. M

    Published in Journal of electronic materials (01-06-2006)
    “…Negative luminescence (NL) refers to the suppression of infrared blackbody emission, and hence an apparent temperature reduction, due to free carrier…”
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    Conference Proceeding Journal Article
  16. 16

    Accurate measurement of composition, carrier concentration, and photoconductive lifetime in Hg1-xCdxTe grown by molecular beam epitaxy by SWARTZ, C. H, CHANDRIL, S, TOMPKINS, R. P, GILES, N. C, MYERS, T. H, EDWALL, D. D, PIQUETTE, E. C, KIM, C. S, VURGAFTMAN, I, MEYER, J. R

    Published in Journal of electronic materials (01-06-2006)
    “…Variable magnetic field Hall and transient photoconductance lifetime measurements were performed on a series of undoped, In-doped, and As-doped HgCdTe samples…”
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    Conference Proceeding Journal Article
  17. 17

    Optical-absorption model for molecular-beam epitaxy HgCdTe and application to infrared detector photoresponse by MOAZZAMI, K, PHILLIPS, J, LEE, D, EDWALL, D, CARMODY, M, PIQUETTE, E, ZANDIAN, M, ARIAS, J

    Published in Journal of electronic materials (01-06-2004)
    “…Accurate knowledge of the optical-absorption coefficient in HgCdTe is important for infrared (IR) detector design, production process (layer screening), and…”
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    Conference Proceeding Journal Article
  18. 18

    MBE growth of HgCdTe epilayers with reduced visible defect densities: kinetics considerations and substrate limitations by PIQUETTE, E. C, ZANDIAN, M, EDWALL, D. D, ARIAS, J. M

    Published in Journal of electronic materials (01-06-2001)
    “…A semi-empirical constraint to the thermodynamical model for growth of Hg1−xCdxTe (MCT) by molecular beam epitaxy is described. This constraint, derived by…”
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    Conference Proceeding Journal Article
  19. 19

    Molecular beam epitaxy growth of high-quality arsenic-doped HgCdTe by EDWALL, D, PIQUETTE, E, ELLSWORTH, J, ARIAS, J, SWARTZ, C. H, BAI, L, TOMPKINS, R. P, GILES, N. C, MYERS, T. H, BERDING, M

    Published in Journal of electronic materials (01-06-2004)
    “…We have initiated a joint effort to better elucidate the fundamental mechanisms underlying As-doping in molecular beam epitaxy (MBE)-grown HgCdTe. We have…”
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    Conference Proceeding Journal Article
  20. 20

    MCT-on-silicon negative luminescence devices with high efficiency by LINDLE, J. R, BEWLEY, W. W, VURGAFTMAN, I, MEYER, J. R, THOMAS, M. L, TENNANT, W. E, EDWALL, D. D, PIQUETTE, E

    Published in Journal of electronic materials (01-08-2007)
    “…We used an InSb radiometric thermal imager to characterize the performance of 1'' × 1'' negative luminescent (NL) arrays. The devices grown on both CdZnTe (two…”
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    Conference Proceeding Journal Article