Search Results - "Pinizzotto, R.F."

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  1. 1

    Synthesis and Characterization of Discrete Luminescent Erbium-Doped Silicon Nanocrystals by St. John, John, Coffer, Jeffery L, Chen, Yandong, Pinizzotto, Russell F

    Published in Journal of the American Chemical Society (10-03-1999)
    “…The preparation of discrete erbium-doped silicon nanoparticles prepared by the co-pyrolysis of disilane and the volatile complex Er(tmhd)3 (tmhd =…”
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    Journal Article
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    Composite TiSi2/n + poly-Si low-resistivity gate electrode and interconnect for VLSI device technology by Wang, K.L., Holloway, T.C., Pinizzotto, R.F., Sobczak, Z.P., Hunter, W.R., Tasch, A.F.

    Published in IEEE transactions on electron devices (01-04-1982)
    “…A composite polycide structure consisting of refractory metal silicide film on top of polysilicon has been considered as a replacement for polysilicon as a…”
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    Journal Article
  3. 3

    Microstructural analysis of nickel silicide formed by nickel/silicon-on-oxide annealing by YANG, H, PINIZZOTTO, R. F, LUO, L, NAMAVAR, F

    Published in Applied physics letters (24-05-1993)
    “…Microstructures of crystalline nickel disilicide thin films formed on SIMOX (separation by implantation of oxygen) Si-on-oxide substrates were analyzed using…”
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    Journal Article
  4. 4

    Surface characterization of amalgams using X-ray photoelectron spectroscopy by Hanawa, T, Takahashi, H, Ota, M, Pinizzotto, R F, Ferracane, J L, Okabe, T

    Published in Journal of dental research (01-09-1987)
    “…This study is the first to report on the use of x-ray photoelectron spectroscopy (XPS or ESCA) for studying the surface films (less than 10 nm thick) of aged…”
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    Journal Article
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    Composite TiSi/sub 2//n+ Poly-Si Low-Resistivity Gate Electrode and Interconnect for VLSI Device Technology by Wang, K.L., Holloway, T.C., Pinizzotto, R.F., Sobczak, Z.P., Hunter, W.R., Tasch, A.F.

    Published in IEEE journal of solid-state circuits (01-04-1982)
    “…A composite polycide structure consisting of refractory metal silicide film on top of polysilicon has been considered as a replacement for polysilicon as a…”
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    Journal Article
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    Stacked CMOS SRAM cell by Chen, C.-E., Lam, H.W., Malhi, S.D.S., Pinizzotto, R.F.

    Published in IEEE electron device letters (01-08-1983)
    “…A static random access memory (SRAM) cell with cross-coupled stacked CMOS inverters is demonstrated for the first time. In this approach, CMOS inverters are…”
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    Journal Article
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    Device fabrication in silicon-on-oxide produced by a scanning CW-laser-induced lateral seeding technique by Hon Wai Lam, Sobczak, Z.P., Pinizzotto, R.F., Tasch, A.F.

    Published in IEEE transactions on electron devices (01-01-1982)
    “…By using a CW-laser-beam-induced lateral seeding technique, which is a zone-melting crystal-growth process, single-crystal silicon-on-oxide with {100}…”
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    Journal Article
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    Thermal annealing behavior of an oxide layer under silicon by Hamdi, A. H., McDaniel, F. D., Pinizzotto, R. F., Matteson, S., Lam, H. W., Malhi, S. D. S.

    Published in Applied physics letters (15-12-1982)
    “…High resolution Rutherford backscattering spectrometry and ion channeling have been employed to evaluate the crystallinity of the surface silicon layer in…”
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    Journal Article
  12. 12

    Novel SOI CMOS design using ultra thin near intrinsic substrate by Malhi, S.D.S., Lam, H.W., Pinizzotto, R.F., Hamdi, A.H., McDaniel, F.D.

    “…A novel SOI CMOS design has been explored. It utilizes an ultra thin near intrinsic substrate wherein no channel doping is introduced during processing. The…”
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    Conference Proceeding
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    MOSFETs Fabricated in single crystal silicon-on-oxide obtained by a laser-induced lateral seeding technique by Lam, H.W., Sobczak, Z.B., Pinizzotto, R.F., Tasch, A.F.

    “…By using a modified LOCOS oxidation process, a 1 µm thick layer of SiO 2 was grown on selected areas of a {100} silicon wafer such that the resulting oxide…”
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    Conference Proceeding
  15. 15

    Effect of implantation energy on surface pitting of SIMOX by Namavar, F., Cortesi, E., Manke, J.M., Kalkhoran, N.M., Buchanan, B.L., Pinizzotto, R.F., Yang, H.

    “…A systematic study to determine the effect of dose and dose rate on implanting oxygen at 80 and 160 keV is reported. Samples were produced by implanting oxygen…”
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    Conference Proceeding
  16. 16

    p-Channel MOSFET's in LPCVD PolySilicon by Malhi, S.D.S., Chatterjee, P.K., Pinizzotto, R.F., Lam, H.W., Chen, C.E.C., Shichijo, H., Shah, R.R., Bellavance, D.W.

    Published in IEEE electron device letters (01-10-1983)
    “…p-channel MOSFET's have been fabricated in LPCVD polysilicon. A 5000-Å n + poly acts as the gate electrode on which a 500-Å thermal oxide is grown to act as…”
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    Journal Article
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    Edge-defined self-alignment of submicrometer overlaid devices by Malhi, S.D.S., Chatterjee, P.K., Bonifield, T.D., Leiss, J.E., Carter, D.E., Pinizzotto, R.F., Coleman, D.J.

    Published in IEEE electron device letters (01-10-1984)
    “…A novel device structure for self-aligning the overlaid device in a stacked CMOS process is introduced and demonstrated. The structure allows submicrometer…”
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    Journal Article
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    SOI CMOS circuit performance on graphite strip heater recrystallized material by Malhi, S.D.S., Lam, H.W., Pinizzotto, R.F.

    “…A CMOS process has been implemented on graphite strip heater recrystallized silicon substrates. The low field electron mobility of 660 cm 2 /V.sec and hole…”
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    Conference Proceeding
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    Composite TiSi2/n+ poly-Si low resistivity gate electrode and interconnect for VLSI device technology by Wang, K.L., Holloway, T.C., Pinizzotto, R.F., Sobczak, Z.P., Hunter, W.R., Tasch, A.F.

    “…A composite polycide structure consisting of coevaporated TiSi 2 film on top of polysilicon is studied as a replacement for polysilicon as gate electrode and…”
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    Conference Proceeding
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    The dependence of the activation energies of intermetallic formation on the composition of composite Sn/Pb solders by Pinizzotto, R.F., Jacobs, E.G., Wu, Y., Sees, J.A., Foster, L.A., Pouraghabagher, C.

    “…The kinetics of the growth of Cu/Sn intermetallics at composite solder/Cu substrate interfaces is examined. The composite solders consist of a eutectic Sn/Pb…”
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    Conference Proceeding