Search Results - "Piner, Edwin"

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  1. 1

    Low Thermal Boundary Resistance Interfaces for GaN-on-Diamond Devices by Yates, Luke, Anderson, Jonathan, Gu, Xing, Lee, Cathy, Bai, Tingyu, Mecklenburg, Matthew, Aoki, Toshihiro, Goorsky, Mark S, Kuball, Martin, Piner, Edwin L, Graham, Samuel

    Published in ACS applied materials & interfaces (18-07-2018)
    “…The development of GaN-on-diamond devices holds much promise for the creation of high-power density electronics. Inherent to the growth of these devices, a…”
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    Journal Article
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    Improved Electrical Properties of AlGaN/GaN High-Electron-Mobility Transistors by In Situ Tailoring the SiN x Passivation Layer by Siddique, Anwar, Ahmed, Raju, Anderson, Jonathan, Holtz, Mark, Piner, Edwin L

    Published in ACS applied materials & interfaces (21-04-2021)
    “…In situ metal–organic chemical vapor deposition growth of SiN x passivation layers is reported on AlGaN/GaN high-electron-mobility transistors (HEMTs) without…”
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    Journal Article
  4. 4

    Effect of reactant gas stoichiometry of in-situ SiNx passivation on structural properties of MOCVD AlGaN/GaN HEMTs by Siddique, Anwar, Ahmed, Raju, Anderson, Jonathan, Piner, Edwin L.

    Published in Journal of crystal growth (01-07-2019)
    “…•In-Situ SiNx passivated AlGaN/GaN HEMTs on Si were grown by MOCVD.•For SiNx growth rate <10 nm/h, SiH4 induced III-N layer etching was prevalent.•Increased…”
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    Journal Article
  5. 5

    Effect of CH4 concentration on the early growth stage of patterned diamond using high seeding density and hot filament chemical vapor deposition by Nugera, Florence A., Devkota, Dipa, Anupam, K. C., Ayala, Anival, Aryal, Ganesh, Engdahl, Chris, Piner, Edwin L., Holtz, Mark W.

    Published in Journal of materials science (01-04-2024)
    “…A bottom-up method is described to grow patterned polycrystalline diamond on silicon substrates using polymer assisted seeding and photolithography. Diamond…”
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    Journal Article
  6. 6

    Self-Heating Profile in an AlGaN/GaN Heterojunction Field-Effect Transistor Studied by Ultraviolet and Visible Micro-Raman Spectroscopy by Nazari, Mohammad, Hancock, Bobby Logan, Piner, Edwin L., Holtz, Mark W.

    Published in IEEE transactions on electron devices (01-05-2015)
    “…Direct measurements of self-heating in gallium nitride (GaN) transistor using ultraviolet (UV) and visible micro-Raman spectroscopy are reported. The material…”
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    Journal Article
  7. 7

    Structure and Interface Analysis of Diamond on an AlGaN/GaN HEMT Utilizing an in Situ SiNx Interlayer Grown by MOCVD by Siddique, Anwar, Ahmed, Raju, Anderson, Jonathan, Nazari, Mohammad, Yates, Luke, Graham, Samuel, Holtz, Mark, Piner, Edwin L

    Published in ACS applied electronic materials (27-08-2019)
    “…Integration of diamond and AlGaN/GaN high-electron mobility transistors (HEMTs) terminated with an in situ grown SiN x interface layer via metal organic…”
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    Journal Article
  8. 8

    RF Dielectric Loss Due to MOCVD Aluminum Nitride on High Resistivity Silicon by Berber, Feyza, Johnson, Derek W., Sundqvist, Kyle M., Piner, Edwin L., Huff, Gregory H., Rusty Harris, H.

    “…The contribution of high-frequency losses from an aluminum nitride (AlN) layer on high resistivity silicon (Si) is reported. The AlN, deposited on silicon via…”
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    Journal Article
  9. 9

    Effect of Gate Leakage in the Subthreshold Characteristics of AlGaN/GaN HEMTs by Chung, J.W., Roberts, J.C., Piner, E.L., Palacios, T.

    Published in IEEE electron device letters (01-11-2008)
    “…This letter studies the effect of gate leakage on the subthreshold slope and ON/OFF current ratio of AlGaN/GaN high-electron mobility transistors (HEMTs). We…”
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    Journal Article
  10. 10

    Schottky-Drain Technology for AlGaN/GaN High-Electron Mobility Transistors by Bin Lu, Piner, E.L., Palacios, T.

    Published in IEEE electron device letters (01-04-2010)
    “…In this letter, we demonstrate 27% improvement in the buffer breakdown voltage of AlGaN/GaN high-electron mobility transistors (HEMTs) grown on Si substrate by…”
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    Journal Article
  11. 11

    Schottky-Ohmic Drain AlGaN/GaN Normally Off HEMT With Reverse Drain Blocking Capability by Chunhua Zhou, Chen, W, Piner, Edwin L, Chen, Kevin J

    Published in IEEE electron device letters (01-07-2010)
    “…In this letter, we propose an AlGaN/GaN normally off high-electron mobility transistor (HEMT) with reverse drain blocking capability. The device features a…”
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    Journal Article
  12. 12

    Observation of terahertz radiation coherently generated by acoustic waves by Kim, Ki-Yong, Glownia, James H, Piner, Edwin L, Armstrong, Michael R, Howard, William M, Roberts, John C, Reed, Evan J

    Published in Nature physics (01-04-2009)
    “…Over the past decade, pioneering and innovative experiments using subpicosecond lasers have demonstrated the generation and detection of acoustic and shock…”
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    Journal Article
  13. 13

    PECVD Silicon Nitride Passivation of AlGaN/GaN Heterostructures by Gatabi, Iman Rezanezhad, Johnson, Derek W., Woo, Jung Hwan, Anderson, Jonathan W., Coan, Mary R., Piner, Edwin L., Harris, Harlan Rusty

    Published in IEEE transactions on electron devices (01-03-2013)
    “…This paper investigates the optimization of PECVD \alpha -SiN-passivated AlGaN/GaN heterostructures to achieve higher 2-D electron gas (2DEG) densities and…”
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    Journal Article
  14. 14

    N-Face GaN/AlGaN HEMTs Fabricated Through Layer Transfer Technology by Chung, J.W., Piner, E.L., Palacios, T.

    Published in IEEE electron device letters (01-02-2009)
    “…We present a new method to fabricate N-face GaN/AlGaN high electron mobility transistors (HEMTs). These devices are extremely promising for ultrahigh frequency…”
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    Journal Article
  15. 15

    107-GHz (Al,Ga)N/GaN HEMTs on Silicon With Improved Maximum Oscillation Frequencies by Tirelli, S., Marti, D., Haifeng Sun, Alt, A.R., Benedickter, H., Piner, E.L., Bolognesi, C.R.

    Published in IEEE electron device letters (01-04-2010)
    “…We report high-speed fully passivated deep submicrometer (Al,Ga)N/GaN high-electron mobility transistors (HEMTs) grown on (111) high-resistivity silicon with…”
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    Journal Article
  16. 16

    Thin-Body N-Face GaN Transistor Fabricated by Direct Wafer Bonding by Ryu, K. K., Roberts, J. C., Piner, E. L., Palacios, T.

    Published in IEEE electron device letters (01-07-2011)
    “…This letter presents a method to fabricate thin-body N-face GaN-on-insulator-on-Si (100) wafers. These new wafers are promising to increase the carrier…”
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    Journal Article
  17. 17

    Self-Heating in a GaN-Based Heterojunction Field-Effect Transistor Investigated by Ultraviolet and Visible Micro-Raman Spectroscopy by Nazari, Mohammad, Hancock, Bobby Logan, Piner, Edwin L., Holtz, Mark W.

    “…Direct measurements are reported of self-heating in an AlGaN/GaN transistor using ultraviolet and visible micro-Raman. Device stack is comprised of silicon…”
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    Conference Proceeding
  18. 18

    Threshold Voltage Shift Due to Charge Trapping in Dielectric-Gated AlGaN/GaN High Electron Mobility Transistors Examined in Au-Free Technology by Johnson, Derek W., Lee, Rinus T. P., Hill, Richard J. W., Man Hoi Wong, Bersuker, Gennadi, Piner, Edwin L., Kirsch, Paul D., Harris, H. Rusty

    Published in IEEE transactions on electron devices (01-10-2013)
    “…We report on the investigation of the charge trapping characteristics of dielectric-gated AlGaN/GaN high electron mobility transistors (HEMTs) with atomic…”
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    Journal Article
  19. 19

    Breakdown mechanism in AlGaN/GaN HEMTs on Si substrate by Bin Lu, Piner, Edwin L, Palacios, Tomas

    Published in 68th Device Research Conference (01-06-2010)
    “…AlGaN/GaN high electron mobility transistors (HEMTs) grown on Si substrates have attracted a great interest for power electronics applications. Despite the low…”
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    Conference Proceeding
  20. 20

    Seamless On-Wafer Integration of Si(100) MOSFETs and GaN HEMTs by Chung, J.W., Jae-kyu Lee, Piner, E.L., Palacios, T.

    Published in IEEE electron device letters (01-10-2009)
    “…The first on-wafer integration of Si(100) MOSFETs and AlGaN/GaN high electron mobility transistors (HEMTs) is demonstrated. To enable a fully Si-compatible…”
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    Journal Article