Search Results - "Peters, W.C.M."
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Experimental proof of current bifurcation and mutual heating in bipolar transistor arrays
Published in 2008 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (01-10-2008)“…We present experimental proof of the electro-thermal bifurcation and mutual heating in bipolar transistor arrays using photon emission microscopy. With this…”
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Conference Proceeding
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The power conversion efficiency of visible light emitting devices in standard BiCMOS processes
Published in 2008 5th IEEE International Conference on Group IV Photonics (01-09-2008)“…We present experimental and theoretical proof for a single and unique relationship between the breakdown voltage and power efficiency of visible light emitting…”
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Conference Proceeding -
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Current mirror test structures for studying adjacent layout effects on systematic transistor mismatch
Published in International Conference on Microelectronic Test Structures, 2003 (2003)“…This paper discusses a new current mirror based test structure that is used to identify and quantify systematic transistor mismatch degradation associated with…”
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Measurement of lithographical proximity effects on matching of bipolar transistors
Published in ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) (1998)“…A measurement approach is described that is used for very accurate bipolar transistor matching characterisation down to the sub 25 /spl mu/V /spl sigma//sub…”
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Conference Proceeding -
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Measuring the span of stress asymmetries on high-precision matched devices
Published in Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516) (2004)“…This paper discusses test structures and measurements to answer the question of how far mixed-signal circuit designers (and test structure designers) should…”
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Conference Proceeding