Search Results - "Pershan, P.S."

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    Langmuir films of polycyclic molecules on mercury by Tamam, L., Kraack, H., Sloutskin, E., Ocko, B.M., Pershan, P.S., Deutsch, M.

    Published in Thin solid films (01-01-2007)
    “…Langmuir films (LFs) of biphenyl and anthracene derivatives on the surface of liquid mercury were studied by surface-specific X-ray and surface tension…”
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    Journal Article Conference Proceeding
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    Surface structure of liquid Bi and Sn: An x-ray reflectivity study by Pershan, P.S., Stoltz, S.E., Shpyrko, Oleg G., Deutsch, Moshe, Balagurusamy, V.S.K., Meron, Mati, Lin, Binhua, Streitel, Reinhard

    “…X-ray reflectivity measurements of the liquid Bi surface are presented and analyzed together with previous liquid Sn results. Published measurements on liquid…”
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    Journal Article
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    Self-Consistent Interpretation of the 2D Structure of the Liquid Au[subscript 82]Si[subscript 18] Surface: Bending Rigidity and the Debye-Waller Effect by Mechler, S., Pershan, P.S., Yahel, E., Stoltz, S.E., Shpyrko, O.G., Lin, B., Meron, M., Sellner, S.

    Published in Physical review letters (17-11-2010)
    “…The structural and mechanical properties of 2D crystalline surface phases that form at the surface of liquid eutectic Au{sub 82}Si{sub 18} are studied using…”
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    Journal Article
  4. 4

    Effects of thermal roughness on X-ray studies of liquid surfaces by Pershan, P.S.

    “…The effects of thermal roughness on X-ray studies of liquid surfaces will be discussed. In contrast to solid surfaces, for which the surface height–height…”
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    Journal Article
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    Structure of a Langmuir Film on a Liquid Metal Surface by Kraack, H., Ocko, B. M., Pershan, P. S., Sloutskin, E., Deutsch, M.

    “…The structure of organic monolayers on liquid surfaces depends sensitively on the details of the molecular interactions. The structure of a stearic acid film…”
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    Journal Article
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    X-ray reflectivity of a polymer monolayer at the water/vapor interface by Schlossman, M. L, Schwartz, D. K, Kawamoto, E. H, Kellogg, G. J, Pershan, P. S, Kim, M. W, Chung, T. C

    Published in Journal of physical chemistry (1952) (01-08-1991)
    “…X-ray specular reflectivity from a monolayer of partially hydroxylated 1,2-polybutadiene (50% butyl alcohol random substitution) at the water/vapor interface…”
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    Journal Article
  9. 9

    The structure of self-assembled monolayers of alkylsiloxanes on silicon: a comparison of results from ellipsometry and low-angle x-ray reflectivity by Wasserman, Stephen R, Whitesides, George M, Tidswell, Ian M, Ocko, Ben M, Pershan, Peter S, Axe, John D

    Published in Journal of the American Chemical Society (01-07-1989)
    “…The thicknesses of C10-C18 alkylsiloxane monolayers on silicon-silicon dioxide substrates have been measured with ellipsometry and low-angle X-ray reflection…”
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    Journal Article
  10. 10

    The structure of organic langmuir films on liquid metal surfaces by Kraack, H, Deutsch, M, Ocko, B.M, Pershan, P.S

    “…Langmuir films (LFs) on water have long been studied for their interest for basic science and their numerous applications in chemistry, physics, materials…”
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    Journal Article
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    Complete wetting of a rough surface : an X-ray study by TIDSWELL, I. M, RABEDEAU, T. A, PERSHAN, P. S, KOSOWSKY, S. D

    Published in Physical review letters (22-04-1991)
    “…The evolution of the surface structure of a wetting film on a rough surface as a function of the film thickness has been studied by x-ray specular reflection…”
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    Journal Article
  13. 13

    Liquid surface order: X-ray reflectivity by Pershan, P.S.

    Published in Physica A (15-09-1996)
    “…This note contains a brief summary of how the X-ray specular reflectivity technique can be used to measure electron density profiles across the bulk/vapor…”
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    Journal Article
  14. 14

    X-ray studies of liquid metal surfaces by Tostmann, H., DiMasi, E., Ocko, B.M., Deutsch, M., Pershan, P.S.

    Published in Journal of non-crystalline solids (01-08-1999)
    “…X-ray reflectivity and diffuse scattering measurements of the surface of liquid Hg, Ga and In are reviewed. For each metal surface induced layering is found…”
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    Journal Article
  15. 15

    Wetting behavior at the free surface of a liquid gallium–bismuth alloy: an X-ray reflectivity study close to the bulk monotectic point by Huber, P, Shpyrko, O.G, Pershan, P.S, Tostmann, H, DiMasi, E, Ocko, B.M, Deutsch, M

    “…We present X-ray reflectivity measurements from the free surface of a liquid gallium–bismuth alloy (Ga–Bi) in the temperature range close to the bulk…”
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    Journal Article
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    Competition between Surface Layering and Surface Phase Formation in Dilute Liquid Hg−Au Alloys by DiMasi, E, Tostmann, H, Ocko, B. M, Pershan, P. S, Deutsch, M

    Published in The journal of physical chemistry. B (11-11-1999)
    “…We present temperature-dependent X-ray reflectivity measurements of liquid Hg alloyed with 0.06−0.20 atom % Au. At low Au concentrations, we find…”
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    Journal Article
  17. 17

    Relaxation and the reentrant appearance of phases in molecular monolayer by SCHLOSSMAN, M. L, SCHWARTZ, D. K, PERSHAN, P. S, KAWAMOTO, E. H, KELLOGG, G. J, LEE, S

    Published in Physical review letters (25-03-1991)
    “…The structure of monolayers of CH{sub 3}(CH{sub 2}){sub 22}COOH on water, along {similar to}21 {degree}C isotherms between 18 and 35 A {sup 2}/molecule, has…”
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    Journal Article
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    Surface structure of the liquid Au[subscript 72]Ge[subscript 28] eutectic phase: X-ray reflectivity by Pershan, P.S., Stoltz, S.E., Mechler, S., Shpyrko, O.G., Grigoriev, A.Y., Balagurusamy, V.S. K., Lin, B.H., Meron, M.

    “…The surface structure of the liquid phase of the Au{sub 72}Ge{sub 28} eutectic alloy has been measured using resonant and nonresonant x-ray reflectivity and…”
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    Journal Article
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    Liquid-vapor density profile of helium : an X-ray study by LURIO, L. B, RABEDEAU, T. A, PERSHAN, P. S, SILVERA, I. F, DEUTSCH, M, KOSOWSKY, S. D, OCKO, B. M

    Published in Physical review letters (27-04-1992)
    “…The average liquid-vapor density profiles {l angle}{rho}({ital z}){r angle} of thick {sup 4}He films adsorbed onto a silicon substrate were measured using…”
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    Journal Article