Search Results - "Perozek, Joshua"
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Chip-less wireless electronic skins by remote epitaxial freestanding compound semiconductors
Published in Science (American Association for the Advancement of Science) (19-08-2022)“…Recent advances in flexible and stretchable electronics have led to a surge of electronic skin (e-skin)–based health monitoring platforms. Conventional…”
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Journal Article -
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First Demonstration of Optically-Controlled Vertical GaN finFET for Power Applications
Published in IEEE electron device letters (01-05-2024)“…In this work, we propose a novel optically-controlled vertical GaN finFET directly triggered by low-power ultraviolet (UV) illumination. The proposed device…”
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Journal Article -
3
Anode-Integrated GaN Field Emitter Arrays for Compact Vacuum Transistors
Published in IEEE electron device letters (01-11-2023)“…Field-emission-based vacuum transistors have been proposed as promising candidates for future high-power and harsh-environment electronic devices. However, the…”
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Journal Article -
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Small-Signal, High Frequency Performance of Vertical GaN FinFETs with fmax = 5.9 GHz
Published in 2021 Device Research Conference (DRC) (20-06-2021)“…GaN vertical finFETs are capable of high breakdown voltages and large current density without the need for regrowth or p-type doping. These attributes make…”
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Conference Proceeding -
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GaN 2.0: Power FinFETs, Complementary Gate Drivers and Low-Cost Vertical Devices
Published in 2021 33rd International Symposium on Power Semiconductor Devices and ICs (ISPSD) (30-05-2021)“…This paper summarizes recent progress on the development of high frequency power switches based on Gallium Nitride (GaN). Both lateral and vertical device…”
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Conference Proceeding -
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InAlN/GaN-on-Si HEMT with 4.5 W/mm in a 200-mm CMOS-Compatible MMIC Process for 3D Integration
Published in 2020 IEEE/MTT-S International Microwave Symposium (IMS) (01-08-2020)“…In this paper we present a fully CMOS-compatible fabrication process for GaN-on-Si monolithic microwave integrated circuits (MMICs) on 200-mm-diameter wafers…”
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Conference Proceeding