Search Results - "Permiakov, Nikita V."

Local analysis of semiconductor nanoobjects by scanning tunneling atomic force microscopy by Lashkova, Natalia A., Permiakov, Nikita V., Maximov, Alexander I., Spivak, Yulia M., Moshnikov, Vyacheslav A.

“…The features of the current–voltage (I–V) measurements in local regions of semiconductor nanostructures by conductive atomic force microscopy (AFM) are…”
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Investigation of a program-controlled process of impregnation of porous semiconductors with silver nanoparticles to create an electrical contact by Permiakov, Nikita V., Matyushkin, Lev B., Belorus, Anton O., Koshevoi, Veniamin L.

“…The original idea is to deposit metal layers from concentrated solutions of colloidal inks of metal nanoparticles (silver) in a programmable pattern using…”
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Detection methods of intense areas and identification of the reasons of HEMT transistors failure by Permiakov, Nikita V., Evseenkov, Anton S., Tarasov, Sergey A., Solomonov, Alexander V., Moshnikov, Vyacheslav A., Lamkin, Ivan A.

“…The article presents the options combination of etching and atomic force microscopy for research work and the failed high electron mobility transistors, as…”
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