Search Results - "Pelz, Philipp M"

Prismatic 2.0 – Simulation software for scanning and high resolution transmission electron microscopy (STEM and HRTEM) by Rangel DaCosta, Luis, Brown, Hamish G., Pelz, Philipp M., Rakowski, Alexander, Barber, Natolya, O’Donovan, Peter, McBean, Patrick, Jones, Lewys, Ciston, Jim, Scott, M.C., Ophus, Colin

“…•Prismatic v2.0 released with suite of new features and functionality.•Improved 3D integration of atomic scattering potentials.•New matrix refocusing algorithm…”
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Solving complex nanostructures with ptychographic atomic electron tomography by Pelz, Philipp M., Griffin, Sinéad M., Stonemeyer, Scott, Popple, Derek, DeVyldere, Hannah, Ercius, Peter, Zettl, Alex, Scott, Mary C., Ophus, Colin

“…Transmission electron microscopy (TEM) is essential for determining atomic scale structures in structural biology and materials science. In structural biology,…”
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Observation of formation and local structures of metal-organic layers via complementary electron microscopy techniques by Peng, Xinxing, Pelz, Philipp M., Zhang, Qiubo, Chen, Peican, Cao, Lingyun, Zhang, Yaqian, Liao, Hong-Gang, Zheng, Haimei, Wang, Cheng, Sun, Shi-Gang, Scott, Mary C.

“…Metal-organic layers (MOLs) are highly attractive for application in catalysis, separation, sensing and biomedicine, owing to their tunable framework…”
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Simultaneous Successive Twinning Captured by Atomic Electron Tomography by Pelz, Philipp M, Groschner, Catherine, Bruefach, Alexandra, Satariano, Adam, Ophus, Colin, Scott, Mary C

“…Shape-controlled synthesis of multiply twinned nanostructures is heavily emphasized in nanoscience, in large part due to the desire to control the size, shape,…”
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Analysis of Strain and Defects in Tellurium-WSe2 Moiré Heterostructures Using Scanning Nanodiffraction by Sari, Bengisu, Zeltmann, Steven E, Zhao, Chunsong, Pelz, Philipp M, Javey, Ali, Minor, Andrew M, Ophus, Colin, Scott, Mary C

“…In recent years, there has been an increasing focus on 2D nongraphene materials that range from insulators to semiconductors to metals. As a single-elemental…”
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On-the-fly scans for X-ray ptychography by Pelz, Philipp M., Guizar-Sicairos, Manuel, Thibault, Pierre, Johnson, Ian, Holler, Mirko, Menzel, Andreas

“…With the increasing importance of nanotechnology, the need for reliable real-time imaging of mesoscopic objects with nanometer resolution is rising. For X-ray…”
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Phase-contrast imaging of multiply-scattering extended objects at atomic resolution by reconstruction of the scattering matrix by Pelz, Philipp M., Brown, Hamish G., Stonemeyer, Scott, Findlay, Scott D., Zettl, Alex, Ercius, Peter, Zhang, Yaqian, Ciston, Jim, Scott, M. C., Ophus, Colin

“…Three-dimensional phase-contrast imaging of multiply-scattering samples in x-ray and electron microscopy is challenging due to small numerical apertures, the…”
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Analysis of Strain and Defects in Tellurium-WSe 2 Moiré Heterostructures Using Scanning Nanodiffraction by Sari, Bengisu, Zeltmann, Steven E., Zhao, Chunsong, Pelz, Philipp M., Javey, Ali, Minor, Andrew M., Ophus, Colin, Scott, Mary C.

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Solving Complex Nanostructures With Ptychographic Atomic Electron Tomography by Pelz, Philipp M, Griffin, Sinead, Stonemeyer, Scott, Popple, Derek, Devyldere, Hannah, Ercius, Peter, Zettl, Alex, Scott, Mary C, Ophus, Colin

“…Transmission electron microscopy (TEM) is a potent technique for the determination of three-dimensional atomic scale structure of samples in structural biology…”
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Real-time interactive 4D-STEM phase-contrast imaging from electron event representation data by Pelz, Philipp M, Johnson, Ian, Ophus, Colin, Ercius, Peter, Scott, Mary C

“…The arrival of direct electron detectors (DED) with high frame-rates in the field of scanning transmission electron microscopy has enabled many experimental…”
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A Fast Algorithm for Scanning Transmission Electron Microscopy (STEM) Imaging and 4D-STEM Diffraction Simulations by Pelz, Philipp M, Rakowski, Alexander, DaCosta, Luis Rangel, Savitzky, Benjamin H, Scott, Mary C, Ophus, Colin

“…Scanning transmission electron microscopy (STEM) is an extremely versatile method for studying materials on the atomic scale. Many STEM experiments are…”
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Real-Time Interactive 4D-STEM Phase-Contrast Imaging From Electron Event Representation Data: Less computation with the right representation by Pelz, Philipp M., Johnson, Ian, Ophus, Colin, Ercius, Peter, Scott, Mary C.

“…The arrival of direct electron detectors (DEDs) with high frame rates in the field of scanning transmission electron microscopy (TEM) has enabled many…”
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Reconstructing the Scattering Matrix from Scanning Electron Diffraction Measurements Alone by Pelz, Philipp M, Brown, Hamish G, Ciston, Jim, Findlay, Scott D, Zhang, Yaqian, Scott, Mary, Ophus, Colin

“…Phys. Rev. Research 3, 023159 (2021) Three-dimensional phase contrast imaging of multiply-scattering samples in X-ray and electron microscopy is extremely…”
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A single-projection three-dimensional reconstruction algorithm for scanning transmission electron microscopy data by Brown, Hamish G, Pelz, Philipp M, Hsu, Shang-Lin, Zhang, Zimeng, Ramesh, Ramamoorthy, Inzani, Katherine, Sheridan, Evan, Griffin, Sinéad M, Schloz, Marcel, Pekin, Thomas C, Koch, Christoph T, Findlay, Scott D, Allen, Leslie J, Scott, Mary C, Ophus, Colin, Ciston, Jim

“…Increasing interest in three-dimensional nanostructures adds impetus to electron microscopy techniques capable of imaging at or below the nanoscale in three…”
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py4DSTEM: a software package for multimodal analysis of four-dimensional scanning transmission electron microscopy datasets by Savitzky, Benjamin H, Hughes, Lauren A, Zeltmann, Steven E, Brown, Hamish G, Zhao, Shiteng, Pelz, Philipp M, Barnard, Edward S, Donohue, Jennifer, DaCosta, Luis Rangel, Pekin, Thomas C, Kennedy, Ellis, Janish, Matthew T, Schneider, Matthew M, Herring, Patrick, Gopal, Chirranjeevi, Anapolsky, Abraham, Ercius, Peter, Scott, Mary, Ciston, Jim, Minor, Andrew M, Ophus, Colin

“…Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms…”
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Real-Time Interactive 4D-STEM Phase-Contrast Imaging From Electron Event Representation Data: Less computation with the right representation by Pelz, Philipp M., Johnson, Ian, Ophus, Colin, Ercius, Peter, Scott, Mary C.

“…The arrival of direct electron detectors (DED) with high frame-rates in the field of scanning transmission electron microscopy has enabled many experimental…”
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