Search Results - "Paz, B. Cardoso"

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  1. 1

    Lambert-W function-based parameter extraction for FDSOI MOSFETs down to deep cryogenic temperatures by Serra di Santa Maria, F., Contamin, L., Cardoso Paz, B., Cassé, M., Theodorou, C., Balestra, F., Ghibaudo, G.

    Published in Solid-state electronics (01-12-2021)
    “…•Lambert-W function-based MOSFET parameter extraction down to cryogenic temperature.•Lambert-W function-based modeling of drain current MOSFET characteristics…”
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    Journal Article
  2. 2

    Cryogenic Operation of Thin-Film FDSOI nMOS Transistors: The Effect of Back Bias on Drain Current and Transconductance by Casse, M., Paz, B. Cardoso, Ghibaudo, G., Poiroux, T., Barraud, S., Vinet, M., de Franceschi, S., Meunier, T., Gaillard, F.

    Published in IEEE transactions on electron devices (01-11-2020)
    “…In this article, we have studied the drain current and transconductance of nMOS fully depleted silicon-on-insulator (FDSOI) transistors operating at low…”
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    Journal Article
  3. 3

    Transport characterization of CMOS-based devices fabricated with isotopically-enriched 28Si for spin qubit applications by Elbaz, G., Casse, M., Labracherie, V., Roussely, G., Bertrand, B., Niebojewski, H., Vinet, M., Balestro, F., Urdampilleta, M., Meunier, T., Paz, B. Cardoso

    “…Both from a scalability and integration perspective, CMOS-based qubits hold great potential for quantum computing applications. However, current fabrication…”
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    Conference Proceeding
  4. 4

    Tunnel and capacitive coupling optimization in FDSOI spin-qubit devices by Bertrand, B., Martinez, B., Li, J., Paz, B. Cardoso, Millory, V., Labracherie, V., Brevard, L., Sahin, H., Roussely, G., Sarrazin, A., Meunier, T., Vinet, M., Niquet, Y.-M., Brun, B., Maurand, R., De Franceschi, S., Niebojewski, H.

    “…We present the ongoing development towards a spin qubit platform compatible with an industrial FDSOI CMOS fabrication flow. We introduce new patterning modules…”
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    Conference Proceeding
  5. 5

    Methodology for an efficient characterization flow of industrial grade Si-based qubit devices by Contamin, L.C., Paz, B. Cardoso, Diaz, B. Martinez, Bertrand, B., Niebojewski, H., Labracherie, V., Sadik, A., Catapano, E., Casse, M., Nowak, E., Niquet, Y.-M., Gaillard, F., Meunier, T., Mortemousque, P.-A., Vinet, M.

    “…On-going efforts in scaling-up solid-state spin qubits are hindered by the need for a characterization workflow that assesses the correct device operation at…”
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    Conference Proceeding
  6. 6

    FDSOI for cryoCMOS electronics: device characterization towards compact model by Casse, M., Paz, B. Cardoso, Bergamaschi, F., Ghibaudo, G., Serra, F., Billiot, G., Jansen, A. G. M., Berlingard, Q., Martinie, S., Bedecarrats, T., Contamin, L., Juge, A., Vincent, E., Galy, P., Pavanello, M.A, Vinet, M., Meunier, T., Gaillard, F.

    “…We present a status of FDSOI transistors electrical characterization for very low temperature operation. We highlight in particular singular transport and…”
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    Conference Proceeding
  7. 7

    Variability Evaluation of 28nm FD-SOI Technology at Cryogenic Temperatures down to 100mK for Quantum Computing by Paz, B. Cardoso, Le Guevel, L., Casse, M., Billiot, G., Pillonnet, G., Jansen, A. G. M., Maurand, R., Haendler, S., Juge, A., Vincent, E., Galy, P., Ghibaudo, G., Vinet, M., de Franceschi, S., Meunier, T., Gaillard, F.

    Published in 2020 IEEE Symposium on VLSI Technology (01-06-2020)
    “…Variability of28nm FD-SOI transistors is evaluated for the first time down to ultra low temperatures (UL T), at T= 1 00mK. High performance is achieved at UL T…”
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    Conference Proceeding
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    A new FDSOI spin qubit platform with 40nm effective control pitch by Bédécarrats, T, Paz, B. Cardoso, Diaz, B. Martinez, Niebojewski, H, Bertrand1, B, Rambal, N, Comboroure, C, Sarrazin, A, Boulard, F, Guyez, E, Hartmann, J. -M, Morand, Y, Magalhaes-Lucas, A, Nowak, E, Catapano, E, Cassé, M, Urdampilleta, M, Niquet, Y. -M, Gaillard, F, De Franceschi, S, Meunier, T, Vinet, M

    Published 07-04-2023
    “…2021 IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA, 2021, pp. 1-4 Operating Si quantum dot (QD) arrays requires homogeneous and…”
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    Journal Article
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