Search Results - "Paz, B. Cardoso"
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Lambert-W function-based parameter extraction for FDSOI MOSFETs down to deep cryogenic temperatures
Published in Solid-state electronics (01-12-2021)“…•Lambert-W function-based MOSFET parameter extraction down to cryogenic temperature.•Lambert-W function-based modeling of drain current MOSFET characteristics…”
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Journal Article -
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Cryogenic Operation of Thin-Film FDSOI nMOS Transistors: The Effect of Back Bias on Drain Current and Transconductance
Published in IEEE transactions on electron devices (01-11-2020)“…In this article, we have studied the drain current and transconductance of nMOS fully depleted silicon-on-insulator (FDSOI) transistors operating at low…”
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Journal Article -
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Transport characterization of CMOS-based devices fabricated with isotopically-enriched 28Si for spin qubit applications
Published in ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC) (11-09-2023)“…Both from a scalability and integration perspective, CMOS-based qubits hold great potential for quantum computing applications. However, current fabrication…”
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Conference Proceeding -
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Tunnel and capacitive coupling optimization in FDSOI spin-qubit devices
Published in 2023 International Electron Devices Meeting (IEDM) (09-12-2023)“…We present the ongoing development towards a spin qubit platform compatible with an industrial FDSOI CMOS fabrication flow. We introduce new patterning modules…”
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Conference Proceeding -
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Methodology for an efficient characterization flow of industrial grade Si-based qubit devices
Published in 2022 International Electron Devices Meeting (IEDM) (03-12-2022)“…On-going efforts in scaling-up solid-state spin qubits are hindered by the need for a characterization workflow that assesses the correct device operation at…”
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Conference Proceeding -
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FDSOI for cryoCMOS electronics: device characterization towards compact model
Published in 2022 International Electron Devices Meeting (IEDM) (03-12-2022)“…We present a status of FDSOI transistors electrical characterization for very low temperature operation. We highlight in particular singular transport and…”
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Conference Proceeding -
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Variability Evaluation of 28nm FD-SOI Technology at Cryogenic Temperatures down to 100mK for Quantum Computing
Published in 2020 IEEE Symposium on VLSI Technology (01-06-2020)“…Variability of28nm FD-SOI transistors is evaluated for the first time down to ultra low temperatures (UL T), at T= 1 00mK. High performance is achieved at UL T…”
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Conference Proceeding -
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Specificities of linear Si QD arrays integration and characterization
Published in 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (12-06-2022)“…The low temperature operation of quantum computing devices implies developing characterization protocols, from extensive statistical tests to targeted device…”
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Conference Proceeding -
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A new FDSOI spin qubit platform with 40nm effective control pitch
Published 07-04-2023“…2021 IEEE International Electron Devices Meeting (IEDM), San Francisco, CA, USA, 2021, pp. 1-4 Operating Si quantum dot (QD) arrays requires homogeneous and…”
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Journal Article -
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Coupling control in the few-electron regime of quantum dot arrays using 2-metal gate levels in CMOS technology
Published in ESSCIRC 2022- IEEE 48th European Solid State Circuits Conference (ESSCIRC) (19-09-2022)“…Scalability is one of the biggest advantages of silicon spin qubits over other platforms, making them very promising candidates in the quest for quantum…”
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Conference Proceeding -
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A new FDSOI spin qubit platform with 40nm effective control pitch
Published in 2021 IEEE International Electron Devices Meeting (IEDM) (11-12-2021)“…Operating Si quantum dot (QD) arrays requires homogeneous and ultra-dense structures with aggressive gate pitch. Such a density is necessary to separately…”
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Conference Proceeding -
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Material and integration challenges for large scale Si quantum computing
Published in 2021 IEEE International Electron Devices Meeting (IEDM) (11-12-2021)“…Si spin qubits are very promising to enable large scale quantum computing as they are fast, of high quality and small. However, they are still lagging behind…”
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Conference Proceeding