Search Results - "Pavelescu, C"
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Thoracoscopic left splanchnicectomy - role in pain control in unresectable pancreatic cancer. Initial experience
Published in Chirurgia (Bucharest, Romania : 1990) (01-05-2014)“…The management of opiate-dependent intractable abdominal pain caused by unresectable pancreatic cancer remains challenging. The aim of this study was to…”
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Risk of malignancy in complex cystic renal masses (Bosniak category III-IV)
Published in European urology supplements : official journal of the European Association of Urology (01-12-2016)Get full text
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1 MHz dielectric constants of phosphosilicate glass films chemically vapour-deposited in the SiH4-PH3-O2-N2 system at low temperature
Published in Journal of materials science (1992)“…The ac relative dielectric constant (RDC) and resistivity of as-deposited and annealed phosphosilicate glass (PSG) films, with phosphorus concentrations in the…”
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Multimodal analgesia - a standard of care in severe surgical thoracic trauma patients?: 14AP7-7
Published in European journal of anaesthesiology (01-06-2013)Get full text
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An etch rate study on thermally annealed SiO2 films deposited in a TEOS-LPCVD system
Published in Journal of materials science (01-02-1990)Get full text
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Thermally annealed phosphosilicate glass films deposited in the SiH4-PH3-O2-N2 system
Published in Journal of materials science letters (01-12-1990)Get full text
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Dry etching of low-temperature chemically vapour deposited phosphosilicate glass films in CF4-Q2 plasma
Published in Journal of materials science letters (1991)Get full text
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An etch-rate study of thermally annealed LTCVD SiO2 films as a function of initial deposition conditions
Published in Journal of materials science letters (01-01-1984)Get full text
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An analysis of the initial oxidation regions of silicon in dry oxygen at atmospheric pressure
Published in Journal of materials science letters (01-10-1988)Get full text
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Dielectric constant and dissipation factor in LTCVD SiO2 films
Published in Journal of materials science letters (1987)Get full text
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A fitting analysis of dry O2 atmospheric pressure silicon oxidation data and correlations with film properties
Published in Journal of materials science letters (01-07-1985)Get full text
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Etch rate of low-temperature chemically vapour deposited SiO2 films in P-etch solution: the effect of deposition conditions
Published in Journal of materials science letters (01-01-1985)Get full text
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The effect of deposition conditions on the refractive index of LTCVD SiO2 films
Published in Journal of materials science letters (01-01-1985)Get full text
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