Search Results - "Paulussen, K."

Enabling focused ion beam sample preparation for application in reverse tip sample scanning probe microscopy by Lagrain, P., Paulussen, K., Grieten, E., Van den Bosch, G., Rachidi, S., Yudistira, D., Wouters, L., Hantschel, T.

“…Focused ion beam (FIB) has become a powerful tool for transmission electron microscopy sample preparation in the nanoelectronics industry and has in recent…”
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Nanosheet-based Complementary Field-Effect Transistors (CFETs) at 48nm Gate Pitch, and Middle Dielectric Isolation to enable CFET Inner Spacer Formation and Multi-Vt Patterning by Mertens, H., Hosseini, M., Chiarella, T., Zhou, D., Wang, S., Mannaert, G., Dupuy, E., Radisic, D., Tao, Z., Oniki, Y., Hikavyy, A., Rosseel, R., Mingardi, A., Choudhury, S., Gowda, P. Puttarame, Sebaai, F., Peter, A., Vandersmissen, K., Soulie, J.P., Keersgieter, A. De, Lima, L. Petersen Barbosa, Cavalcante, C., Batuk, D., Martinez, G.T., Geypen, J., Seidel, F., Paulussen, K., Favia, P., Boemmels, J., Loo, R., Wong, P., Marquez, A. Sepulveda, Chan, B.T., Mitard, J., Subramanian, S., Demuynck, S., Litta, E. Dentoni, Horiguchi, N., Samavedam, S., Biesemans, S.

“…We report on Si nanosheet monolithic Complementary Field-Effect Transistors (CFETs) at industry-relevant 48nm gate pitch, with source-drains (SDs) and SD…”
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Ovarian cysts in the fetus and neonate-changes in sonographic pattern in the follow-up and their management by MÜLLER-LEISSE, C, BICK, U, PAULUSSEN, K, TRÖGER, J, ZACHARIOU, Z, HOLZGREVE, W, SCHUHMACHER, R, HORVITZ, A

“…In a multicenter trial we retrospectively evaluated the clinical and sonographic data of 49 neonatal ovarian cysts, 44 of which were detected prenatally and 5…”
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