Search Results - "Paulin Filho, P I"

Potential barriers in PTC barium titanate observed by EFM by GHENO, S. M, HASEGAWA, H. L, PIMENTEL, V. L, PAULIN FILHO, P. I

“…The electric properties of ceramic PTC can be observed through the nature of the grains boundaries, and the levels of energy involved in their process were not…”
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XPS and atomic force microscopy analyses of thin Au and Cu films on Pd by Maluf, S. S., Gobbi, A. L., Paulin-Filho, P. I., Nascente, P. A. P.

“…The surface properties of bimetallic systems have been studied recently due to possible applications in different areas, such as electrochemistry, magnetism,…”
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AC impedance study of Ni, Fe, Cu, Mn doped ceria stabilized zirconia ceramics by Foschini, C.R, Souza, D.P.F, Paulin Filho, P.I, Varela, J.A

“…Doped zirconia has been used in electronic applications in the cubic crystalline phase. Ceria-stabilized tetragonal zirconia presents high toughness and can…”
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Structure, morphology, and composition of nanometric Pd films deposited by dc magnetron sputtering on Cu, Ag, and Au foils by Nascente, P.A.P., Maluf, S.S., Pinheiro, L.M.P., Gobbi, A.L., Paulin-Filho, P.I., Fantini, M.C.A., Alcântara, N.G.

“…The comprehension of atomic and electronic structures of bimetallic systems is important in several areas, such as catalysis, sensors, and microelectronics…”
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Growth and surface characterization of TiNbZr thin films deposited by magnetron sputtering for biomedical applications by Tallarico, D.A., Gobbi, A.L., Paulin Filho, P.I., Maia da Costa, M.E.H., Nascente, P.A.P.

“…Low modulus of elasticity and the presence of non-toxic elements are important criteria for the development of materials for implant applications. Low modulus…”
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AFM Characterization of Barium Titanate by Gheno, S. M., Hasegawa, H. L., Paulin Filho, P. I.

“…Barium titanate is the main constituent of PTC materials and their electric properties are sensitive to microstructure and defects, in atomic scale, that are…”
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Direct observation of potential barrier behavior in yttrium–barium titanate observed by electrostactic force microscopy by Gheno, S.M., Hasegawa, H.L., Paulin Filho, P.I.

“…Electrostatic force microscopy (EFM) was used to directly probe, and thereby characterize, both the surface morphology and surface potential of semiconducting…”
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Direct probing of semiconductor barium titanate via electrostatic force microscopy by Gheno, S. M., Hasegawa, H. L., Paulin Filho, P. I.

“…Electrostatic force microscopy (EFM) was used to directly probe surface potential in doped barium titanate semiconducting ceramics. EFM measurements were…”
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Electric force microscopy investigations of barrier formations in ZnO-based varistors by Gheno, S.M., Kiminami, R.H.G.A., Morelli, M.R., Paulin Filho, P.I.

“…The well known metal-oxide varistors (MOVs) are polycrystalline electronic ceramic materials whose electrical behavior is dominated by their grain boundaries…”
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Potential barriers mapping by atomic force microscopy in lanthanum doped BaTiO3 based ceramics by Mancini, M W, Filho, P I Paulin

“…Barium titanate (BaTiO3) based ceramics doped with La as donor (0.4at%t) and Mn as acceptor (150 ppm) were investigated through atomic force microscopy…”
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MAGNETIC DOMAINS IN BARIUM HEXAFERRITE MAGNETISED PROGRESSIVELY by Gheno, S M, Correa, R R, Paulin, Filho P I

“…The structure of magnetic domains in barium hexaferrite was investigated using magnetic force microscopy through the application of an external magnetic field…”
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Barreiras de potencial mapeadas por microscopia de força atômica em cerâmicas à base de BaTiO3 dopadas com lantânio by Mancini, M. W., Paulin Filho, P. I.

“…Cerâmicas à base de titanato de bário (BaTiO3) dopadas com 0,4% em mol de La e 150 ppm de Mn foram investigadas por microscopia de força atômica no modo de…”
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Barreiras de potencial mapeadas por microscopia de força atômica em cerâmicas à base de BaTiO3 dopadas com lantânio Potential barriers mapping by atomic force microscopy in lanthanum doped BaTiO3 based ceramics by M. W. Mancini, P. I. Paulin Filho

“…Cerâmicas à base de titanato de bário (BaTiO3) dopadas com 0,4% em mol de La e 150 ppm de Mn foram investigadas por microscopia de força atômica no modo de…”
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Direct probing of semiconductor barium titanate via electrostatic force microscopy Sondagem direta de titanato de bário semicondutorpor meio de microscopia de força eletrostática by S. M. Gheno, H. L. Hasegawa, P. I. Paulin Filho

“…Electrostatic force microscopy (EFM) was used to directly probe surface potential in doped barium titanate semiconducting ceramics. EFM measurements were…”
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Domínios magnéticos em hexaferrita de bário magnetizada progressivamente by Gheno, S. M., Corrêa, R. R., Paulin Filho, P. I.

“…As hexaferritas de bário são óxidos ferrimagnéticos hexagonais que atraem grandes interesses científicos, tecnológicos e industriais como uso de magneto…”
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Domínios magnéticos em hexaferrita de bário magnetizada progressivamente Magnetic domains in barium hexaferrite magnetized progressively by S. M. Gheno, R. R. Corrêa, P. I. Paulin Filho

“…As hexaferritas de bário são óxidos ferrimagnéticos hexagonais que atraem grandes interesses científicos, tecnológicos e industriais como uso de magneto…”
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Análise da superfície de grês porcelanato por microscopia de força atômica by Fernandes, M. C. S., Paulin Filho, P. I., Morelli, M. R.

“…A superfície de porcelanatos polidos foi investigada através da Microscopia de Força Atômica (AFM). Ênfase foi dada à investigação dos parâmetros de rugosidade…”
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Análise da superfície de grês porcelanato por microscopia de força atômica Porcelain stoneware tile surface analysis by atomic force microscopy by M. C. S. Fernandes, P. I. Paulin Filho, M. R. Morelli

“…A superfície de porcelanatos polidos foi investigada através da Microscopia de Força Atômica (AFM). Ênfase foi dada à investigação dos parâmetros de rugosidade…”
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Porcelain stoneware tile surface analysis by atomic force microscopy by Fernandes, M C S, Paulin Filho, P I, Morelli, M R

“…The surface of polished porcelain stoneware tile surface was investigated through Atomic Force Microscopy (AFM). Emphasis was given to the investigation of the…”
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