Search Results - "Parlee, M.R."

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    Reliability evaluation of hermetic GaAs HEMT MMICs using wafer-scale-assembly technology for compact and light-weight applications by Chou, Y.C., Chang-Chien, P., Leung, D.L., Kono, R.K., Zeng, X., Parlee, M.R., Hennig, K., Eng, D.C., Trucker, C., Tsai, R.S., Wojtowicz, M., Barsky, M.E., Oki, A.K., Block, T.

    “…Wafer-scale-assembly (WSA) technology has been developed for compact and light-weight applications at the Northrop Grumman Corporation. To insure successful…”
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