Search Results - "Park, Segeun"

Reliability of a Tablet Computer-Based Dyslexia Screening Application Using an Eye-Tracking System by Park, Segeun, Song, Jonggeun, Eom, Tae-Hoon, Kim, Young-Hoon

“…Purpose: The early detection and management of dyslexia are crucial for preventing irreversible educational gaps and various negative consequences for affected…”
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Roles of Residual Stress in Dynamic Refresh Failure of a Buried-Recessed-Channel-Array Transistor (B-CAT) in DRAM by Park, Segeun, Seo, Hyeongwon, Oh, Jeonghoon, Kim, Ilgweon, Hong, Hyoungsun, Jin, Gyoyoung, Roh, Yonghan

“…We clarify the role of metal gates (e.g., TiN) on the degradation of the state-of-the-art buried-channel-array transistor (B-CAT) in dynamic random access…”
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FN-degradation of S-RCAT with different grain size and oxidation method by Park, Segeun, Kim, Ilgweon, Park, Yongjik, Choi, Joosun, Roh, Yonghan

“…•We realized Sphere-shaped-recess-cell-array-transistor to improve short channel effect.•Negative shift of threshold voltage and increase of swing were…”
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Off-state degradation with ac bias in PMOSFET by Park, Segeun, Jung, Hyuckchai, Oh, Jeonghoon, Kim, Ilgweon, Hong, Hyoungsun, Jin, Gyoyoung, Roh, Yonghan

“…For the first time, the current failure of p-channel MOSFETs used for the sub-wordline driver of state-of-the-art DRAM chips was investigated during off-state…”
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FN-degradation of S-RCAT with different grain size and oxidation method: Micro/Nano Devices and Systems 2013: An open thematic journal issue by SEGEUN PARK, ILGWEON KIM, YONGJIK PARK, JOOSUN CHOI, YONGHAN ROH

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