Improved optical and electrical properties for heterojunction solar cell using Al2O3/ITO double-layer anti-reflective coating

•Improvement in the optical, structural, and electrical properties.•An advanced ray tracking model is used to optimize optical properties.•Decrease in average reflection from 9.33% to 4.74% and enhancement in EQE from 76.89% to 84.34% for Al2O3/ITO double layer coating as compared to only ITO layer...

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Bibliographic Details
Published in:	Results in physics Vol. 28; p. 104640
Main Authors:	Zahid, Muhammad Aleem, Khokhar, Muhammad Quddamah, Cui, Ziyang, Park, Hyeonggi, Yi, Junsin
Format:	Journal Article
Language:	English
Published:	Elsevier B.V 01-09-2021 Elsevier
Subjects:	Double layered anti-reflection coating Electrical Properties Optical Properties Silicon heterojunction solar cell TCO Optical Properties ITO Double layered anti-reflection coating Electrical Properties DLARC SLARC AM c-Si a-Si Al2O3 ARC SHJ a-Si:H Silicon heterojunction solar cell EQE
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Summary:	•Improvement in the optical, structural, and electrical properties.•An advanced ray tracking model is used to optimize optical properties.•Decrease in average reflection from 9.33% to 4.74% and enhancement in EQE from 76.89% to 84.34% for Al2O3/ITO double layer coating as compared to only ITO layer in the wavelength spectrum at 300–1100 nm.•Jsc enhances to 41.13 mA/cm2 and maximum conversion efficiency of 21.6%. Silicon heterojunction solar cells have been gaining remarkable attention in the photovoltaic industry in recent years owing to their low temperature coefficient and high efficiency. This study aimed to maximize the short circuit current density (Jsc), which is directly correlated with the absorbance of the solar cells. An advanced ray tracking model and hall effect measurement was used to improve the optical properties of Al2O3/ITO as a double-layered anti-reflection coating (DLARC) on the solar cell. RF/DC power sputtering system was used to deposit ITO layer, while atomic layer deposition was used to deposit Al2O3 on ITO to create a DLARC. An average decrease in reflection from 9.33% to 4.74% and enhancement in EQE from 76.89% to 84.34% were observed for the DLARC in the wavelength spectrum at 300–1100 nm. It also exhibited a higher Jsc value of 41.13 mA/cm2 and maximum conversion efficiency of 21.6%. The findings of both simulation and experiments showed that the Al2O3/ITO DLARC has better anti-reflection properties than a single-layer ITO coating.
ISSN:	2211-3797 2211-3797
DOI:	10.1016/j.rinp.2021.104640