Search Results - "Pantano, Devis"

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    Characterisation of a thin fully depleted SOI pixel sensor with high momentum charged particles by Battaglia, Marco, Bisello, Dario, Contarato, Devis, Denes, Peter, Giubilato, Piero, Mattiazzo, Serena, Pantano, Devis

    “…This paper presents the results of the characterisation of a thin fully depleted pixel sensor manufactured in SOI technology on high-resistivity substrate with…”
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    Journal Article
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    iMPACT: An Innovative Tracker and Calorimeter for Proton Computed Tomography by Mattiazzo, Serena, Baruffaldi, Filippo, Bisello, Dario, Di Ruzza, Benedetto, Giubilato, Piero, Iuppa, Roberto, La Tessa, Chiara, Pantano, Devis, Pozzobon, Nicola, Ricci, Ester, Snoeys, Walter, Wyss, Jeffery

    “…This contribution describes the first results obtained within the iMPACT project, which aims to build a novel proton computed-tomography (pCT) scanner for…”
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    Journal Article
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    Studies of vertex tracking with SOI pixel sensors for future lepton colliders by Battaglia, Marco, Contarato, Devis, Denes, Peter, Liko, Dietrich, Mattiazzo, Serena, Pantano, Devis

    “…This paper presents a study of vertex tracking with a beam hodoscope consisting of three layers of monolithic pixel sensors in SOI technology on…”
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    Journal Article
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    Total Dose Effects on a FD-SOI Technology for Monolithic Pixel Sensors by Mattiazzo, Serena, Battaglia, Marco, Bisello, Dario, Contarato, Devis, Denes, Peter, Giubilato, Piero, Pantano, Devis, Pozzobon, Nicola, Tessaro, Mario, Wyss, Jeffery

    Published in IEEE transactions on nuclear science (01-08-2010)
    “…Monolithic pixel detectors in deep-submicron Fully Depleted (FD) Silicon On Insulator (SOI) technology have been developed and characterized. This summary…”
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    Journal Article
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    Investigating Degradation Mechanisms in 130 nm and 90 nm Commercial CMOS Technologies Under Extreme Radiation Conditions by Ratti, L., Gaioni, L., Manghisoni, M., Traversi, G., Pantano, D.

    Published in IEEE transactions on nuclear science (01-08-2008)
    “…The purpose of this paper is to study the mechanisms underlying performance degradation in 130 nm and 90 nm commercial CMOS technologies exposed to high doses…”
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    Journal Article
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    Proposta di nuovi strumenti per comprendere come funziona la cognizione (Novel tools to understand how cognition works) by Pantano, Devis

    Published 07-01-2014
    “…I think that the main reason why we do not understand the general principles of how knowledge works (and probably also the reason why we have not yet designed…”
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    Journal Article
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    Ion Impact Detection and Micromapping With a SDRAM for IEEM Diagnostics and Applications by Bertazzoni, S., Bisello, D., Giubilato, P., Kaminsky, A., Mattiazzo, S., Mongiardo, L., Pantano, D., Rando, R., Salmeri, M., Salsano, A., Silvestrin, L., Tessaro, M., Wyss, J.

    Published in IEEE transactions on nuclear science (01-06-2009)
    “…Ion electron emission microscopy (IEEM) can provide an alternative approach to microbeams for micrometric characterization of the sensitivity map to single…”
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    Journal Article
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    Characterisation of a thin, fully-depleted, back-illuminated SOI pixel sensor with soft X-ray radiation by Battaglia, M., Bisello, D., Celestre, R., Contarato, D., Denes, P., Giubilato, P., Mattiazzo, S., Pantano, D., Tindall, C.

    “…THE availability of the Silicon on Insulator (SOI) process at OKI Inc. (now Lapis Semiconductor) with an handle wafer of moderate resistivity and contacts…”
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    Conference Proceeding
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    A novel sensor for ion electron emission microscopy by Bisello, Dario, Dal Maschio, Marco, Giubilato, Piero, Kaminsky, Alexander, Nigro, Massimo, Pantano, Devis, Rando, Riccardo, Tessaro, Mario, Wyss, Jeffery

    “…An ion electron emission microscope (IEEM) to be installed at the SIRAD heavy ion irradiation facility at the 15 MV tandem accelerator of the INFN Legnaro…”
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    Journal Article
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    Studies of Vertex Tracking with SOI Pixel Sensors for Future Lepton Colliders by Battaglia, Marco, Contarato, Devis, Denes, Peter, Liko, Dietrich, Mattiazzo, Serena, Pantano, Devis

    Published 13-04-2012
    “…This paper presents a study of vertex tracking with a beam hodoscope consisting of three layers of monolithic pixel sensors in SOI technology on…”
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    Journal Article
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    Characterisation of a Thin Fully Depleted SOI Pixel Sensor with High Momentum Charged Particles by Battaglia, Marco, Bisello, Dario, Contarato, Devis, Denes, Peter, Giubilato, Piero, Mattiazzo, Serena, Pantano, Devis

    Published 06-02-2012
    “…This paper presents the results of the characterisation of a thin, fully depleted pixel sensor manufactured in SOI technology on high-resistivity substrate…”
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    Journal Article
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    Characterisation of a Pixel Sensor in 0.20 micron SOI Technology for Charged Particle Tracking by Battaglia, Marco, Bisello, Dario, Contarato, Devis, Denes, Peter, Giubilato, Piero, Mattiazzo, Serena, Pantano, Devis, Zalusky, Sarah

    Published 04-03-2011
    “…Nuclear Inst. and Methods in Physics Research, A 650 (2011), pp. 55-58 This paper presents the results of the characterisation of a pixel sensor manufactured…”
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    Journal Article
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    Tracking and Vertexing with a Thin CMOS Pixel Beam Telescope by Battaglia, Marco, Bisello, Dario, Bolla, Gino, Bortoletto, Daniela, Contarato, Devis, Franchino, Silvia, Giubilato, Piero, Glesener, Lindsay, Hooberman, Benjamin, Pantano, Devis

    Published 11-05-2008
    “…Nucl.Instrum.Meth.A593:292-297,2008 We present results of a study of charged particle track and vertex reconstruction with a beam telescope made of four layers…”
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    Journal Article
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    Investigating degradation mechanisms in 130 nm and 90 nm commercial CMOS technologies exposed to up to 100 Mrad ionizing radiation dose by Ratti, L., Gaioni, L., Manghisoni, M., Traversi, G., Pantano, D.

    “…The purpose of this paper is to study the mechanisms underlying performance degradation in 130 nm and 90 nm commercial CMOS technologies exposed to high doses…”
    Get full text
    Conference Proceeding