Properties of Reactive Argon Plasmas at Atmospheric Pressure

Summary form only given. A new atmospheric pressure plasma source has been developed that shows exceedingly high processing rates. For example, kapton films have been etched at 5.0 mum/s using an argon and oxygen discharge with 6.0 vol.% O 2 and a temperature of 280degC. The plasma source consisted...

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Bibliographic Details
Published in:IEEE Conference Record - Abstracts. 2005 IEEE International Conference on Plasma Science p. 264
Main Authors: Moravej, M., Hicks, R., Xiawan Yang, Babayan, S., Panelon, J.
Format: Conference Proceeding
Language:English
Published: IEEE 01-06-2005
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Summary:Summary form only given. A new atmospheric pressure plasma source has been developed that shows exceedingly high processing rates. For example, kapton films have been etched at 5.0 mum/s using an argon and oxygen discharge with 6.0 vol.% O 2 and a temperature of 280degC. The plasma source consisted of a small quartz tube that was capacitively coupled to radio frequency power at 13.56 MHz. The input plasma power could be increased up to 150 W/cm 3 without arcing, or forming a streamer like discharge. At this power density, the gas temperature was determined by spectroscopic methods to be 300plusmn30degC. The O atom concentration was measured in the plasma afterglow by nitric oxide titration, and was found to be 1.2plusmn0.6times10 17 cm -3 at 150 W/cm 3 and 6.0 vol.% O 2 in Ar. The concentration of ozone in the downstream region equaled 4.3plusmn0.5times10 14 cm -3 , as determined by UV absorption spectroscopy. These results were found to be in good agreement with a numerical model of the plasma and afterglow that included the reaction mechanism and the plasma electron density and temperature as calculated from current-voltage measurements
ISBN:0780393007
9780780393004
ISSN:0730-9244
2576-7208
DOI:10.1109/PLASMA.2005.359349