Search Results - "Pamukchieva, V."
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Evaluation of basic physical parameters of quaternary Ge–Sb-(S,Te) chalcogenide glasses
Published in Journal of non-crystalline solids (01-12-2009)“…New quaternary chalcogenide Ge x Sb 40− x S 50Te 10 ( x = 10, 20 and 27 at.%) and Ge x Sb 40− x S 55Te 5 ( x = 20 and 27 at.%) glasses have been synthesized…”
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2
Surface topographic study of chalcogenide thin films of GexSb(As)40−xS50Te10 glasses
Published in Micron (Oxford, England : 1993) (01-04-2014)“…•Results on AFM surface imaging of GexSb(As)40−xS50Te10 films are reported.•The films are continuous, isotropic, considerably smooth and show fractal…”
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3
Optical properties of GexSb20−xTe80 thin films and their changes by light illumination
Published in Optical materials (01-03-2008)“…The influence of light illumination on the optical constants of chalcogenide thin films with non-stoichiometric GexSb20−xTe80 (x=15,17,19) composition is…”
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Journal Article Conference Proceeding -
4
Study of As―Se―Te glasses by neutron-, X-ray diffraction and optical spectroscopic methods
Published in Journal of non-crystalline solids (15-02-2012)“…The atomic structures of amorphous As40Se(60−x)Tex (x=10 and 15) and As40Se60 glasses have been investigated by neutron and high energy X-ray diffraction…”
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5
Compositional dependence of the optical properties of new quaternary chalcogenide glasses of Ge–Sb–(S,Te) system
Published in Optical materials (01-11-2009)“…New quaternary telluride glassy materials with composition of Ge x Sb 40− x S 50Te 10 and Ge x Sb 40− x S 55Te 5 ( x = 10, 20, and 27) have been synthesized…”
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Spectroscopic ellipsometry study of the effect of illumination and thermal annealing on the optical constants of thin Ge–As–S films
Published in Physica scripta (01-02-2011)Get full text
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7
Photoinduced changes in sulphur rich Ge-As-S thin films
Published in Journal of Optoelectronics and Advanced Materials (01-09-2009)“…The irreversible and reversible photoinduced (PI) changes in thin films of Ge(11.2)As(18)S(70.8)glass (Z = 2.4) have been studied. Glasses with compositions…”
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8
Study of photo- and thermally-induced changes in Ge-As-S thin films by spectroscopic ellipsometry
Published in Journal of Optoelectronics and Advanced Materials (01-09-2009)“…The effect of illumination and post-illumination annealing on the optical properties and thicknesses of thin (~ 150 nm) films of Ge(30.8)As(5.7)S(63.5) and…”
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9
Irreversible and reversible changes in band gap and volume of chalcogenide films
Published in Journal of non-crystalline solids (01-10-2003)“…Irreversible and reversible changes induced by illumination and/or annealing of thin evaporatively deposited Ge-As-S films at normal incidence are studied…”
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10
On the structural phase transformations in GexSb40−xSe60 glasses
Published in Journal of non-crystalline solids (01-11-2001)“…A correlation between the observed peculiarities in the variation of some physicochemical parameters of GexSb40-xSe60 (x=10, 20, 25, 27, 32, 35) glasses and…”
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11
PHOTOINDUCED CHANGES IN Ge-As-S THIN FILMS WITH VARIOUS NETWORK RIGIDITIES
Published in Journal of Optoelectronics and Advanced Materials (01-06-2005)“…Photo- and thermally induced changes in the optical bandgap and thickness are investigated in thin films that belong to three lines traced through regions with…”
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12
Influence of illumination on the microhardness and elastic properties of thin GexSb40-xS60 films
Published in Thin solid films (22-06-1999)Get full text
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13
Mechanical stress studies of amorphous GexSb40-xS60 film
Published in Journal of non-crystalline solids (15-09-2003)“…Mechanical stress in the GexSb40-xS60 film/Si substrate system has been examined before and after film treatment (illumination and/or annealing). The intrinsic…”
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14
Optical study of GexSb20-xTe80 chalcogenide films
Published in Journal of materials science. Materials in electronics (01-10-2003)“…The optical properties of Ge^sub x^Sb^sub 20-x^Te^sub 80^ films with x values of 15, 17, and 19, lying in the glass-forming region of the Ge-Sb-Te system, have…”
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Conference Proceeding Journal Article -
15
CHANGES IN THE ELECTRONIC STRUCTURE OF Ge-As-S THIN FILMS AFTER ILLUMINATION
Published in Journal of Optoelectronics and Advanced Materials (01-06-2005)“…The electronic structure of Ge-As-S glasses and films has been studied by means of X-ray photoelectron spectroscopy (XPS). Several compositions from two lines…”
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16
X-ray photoelectron spectroscopy studies of thin GexSb40-xS60 chalcogenide films
Published in Journal of non-crystalline solids (2002)“…Thin GexSb40-xS60 (x=5, 15, 20, 25 and 27) chalcogenide films have been investigated by XPS. XPS spectra show that there is a peculiarity in the relative…”
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17
Photo- and thermo-induced bandgap and volume changes in Ge-based chalcogenide films
Published in Journal of materials science. Materials in electronics (01-10-2003)“…Irreversible and reversible changes induced by illumination and/or annealing of thin Ge-As-S films are studied. Attention is paid to the volume (thickness)…”
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Conference Proceeding Journal Article -
18
Mossbauer and XPS structural study of (Ge, Sn)-As-S glasses
Published in Journal of Optoelectronics and Advanced Materials (01-08-2007)“…The local structure and the electronic properties of three Ge-As-S glasses are studied by 19Sn MOssbauer and X-ray photoelectron spectroscopies. For the former…”
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19
Compositional dependence of the optical parameters of GexSb40-xSe60 glasses
Published in Journal of non-crystalline solids (02-12-1998)Get full text
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20
Crystallization kinetics of Ge10Sb30Se60 glass
Published in Thermochimica acta (26-05-1998)Get full text
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