Search Results - "Pala, Marco G"

Refine Results
  1. 1

    Full-Band Quantum Transport of Heterojunction Electron Devices With Empirical Pseudopotentials by M'foukh, Adel, Pala, Marco G., Esseni, David

    Published in IEEE transactions on electron devices (01-12-2020)
    “…This article presents the methodology, implementation, and application of a full-band quantum transport model based on the nonequilibrium Green's function…”
    Get full text
    Journal Article
  2. 2

    A Steep-Slope MoS2-Nanoribbon MOSFET Based on an Intrinsic Cold-Contact Effect by Logoteta, Demetrio, Pala, Marco G., Choukroun, Jean, Dollfus, Philippe, Iannaccone, Giuseppe

    Published in IEEE electron device letters (01-09-2019)
    “…We propose a steep-slope MoS 2 -nanoribbon field-effect transistor that exploits a narrow-energy conduction band to intrinsically filter out the thermionic…”
    Get full text
    Journal Article
  3. 3

    Interface Traps in InAs Nanowire Tunnel FETs and MOSFETs-Part II: Comparative Analysis and Trap-Induced Variability by Esseni, David, Pala, Marco G.

    Published in IEEE transactions on electron devices (01-09-2013)
    “…This paper extends the analysis of the companion paper by presenting a comparative analysis of the impact of interface traps on the I-V characteristics of InAs…”
    Get full text
    Journal Article
  4. 4

    Interface Traps in InAs Nanowire Tunnel-FETs and MOSFETs-Part I: Model Description and Single Trap Analysis in Tunnel-FETs by Pala, Marco G., Esseni, David

    Published in IEEE transactions on electron devices (01-09-2013)
    “…This paper and the companion work present a full quantum study of the influence of interface traps on the I-V characteristics of InAs nanowire Tunnel-field…”
    Get full text
    Journal Article
  5. 5

    Essential Physics of the OFF-State Current in Nanoscale MOSFETs and Tunnel FETs by Esseni, David, Pala, Marco G., Rollo, Tommaso

    Published in IEEE transactions on electron devices (01-09-2015)
    “…We present a study about of the essential physical elements governing the OFF-state current in MOSFETs and tunnel FETs at truly nanoscale dimensions. By…”
    Get full text
    Journal Article
  6. 6

    Assessment of the Electrical Performance of Short Channel InAs and Strained Si Nanowire FETs by Grillet, Corentin, Logoteta, Demetrio, Cresti, Alessandro, Pala, Marco G.

    Published in IEEE transactions on electron devices (01-05-2017)
    “…We present a numerical study aimed to benchmark short gate InAs nanowire-FETs (NW-FETs) against their strained Si (sSi) counterpart. Our full-quantum…”
    Get full text
    Journal Article
  7. 7

    Operation and Design of van der Waals Tunnel Transistors: A 3-D Quantum Transport Study by Jiang Cao, Logoteta, Demetrio, Ozkaya, Sibel, Biel, Blanca, Cresti, Alessandro, Pala, Marco G., Esseni, David

    Published in IEEE transactions on electron devices (01-11-2016)
    “…We propose a model Hamiltonian for van der Waals tunnel transistors (vdW-TFETs) relying on few physical parameters calibrated against density functional theory…”
    Get full text
    Journal Article
  8. 8

    Large On-Current Enhancement in Hetero-Junction Tunnel-FETs via Molar Fraction Grading by Brocard, Sylvan, Pala, Marco G., Esseni, David

    Published in IEEE electron device letters (01-02-2014)
    “…We propose to employ a grading of the molar fraction in the source region of III-V hetero-junction tunnel-FETs as a means to improve the on-current without…”
    Get full text
    Journal Article
  9. 9

    Superconducting proximity effect in interacting quantum dots revealed by shot noise by Braggio, Alessandro, Governale, Michele, Pala, Marco G., König, Jürgen

    Published in Solid state communications (01-01-2011)
    “…We study the full counting statistics of charge transport through a quantum dot tunnel coupled to one normal and one superconducting lead with a large…”
    Get full text
    Journal Article
  10. 10
  11. 11

    On the origins of transport inefficiencies in mesoscopic networks by Toussaint, Sébastien, Martins, Frederico, Faniel, Sébastien, Pala, Marco G., Desplanque, Ludovic, Wallart, Xavier, Sellier, Hermann, Huant, Serge, Bayot, Vincent, Hackens, Benoit

    Published in Scientific reports (14-02-2018)
    “…A counter-intuitive behavior analogous to the Braess paradox is encountered in a two-terminal mesoscopic network patterned in a two-dimensional electron system…”
    Get full text
    Journal Article
  12. 12

    Exploiting Hetero-Junctions to Improve the Performance of III-V Nanowire Tunnel-FETs by Pala, Marco G., Brocard, Sylvan

    “…This paper presents full-quantum 3-D simulations predicting the electrical performance of nanowire tunnel-FETs based on III-V hetero-junctions. Our…”
    Get full text
    Journal Article
  13. 13
  14. 14

    Impact of inelastic phonon scattering in the OFF state of Tunnel-field-effect transistors by Pala, Marco G., Grillet, Corentin, Cao, Jiang, Logoteta, Demetrio, Cresti, Alessandro, Esseni, David

    Published in Journal of computational electronics (01-12-2016)
    “…We study the impact of electron–phonon interaction on the subthreshold operation region of Tunnel-FETs by means of full-quantum simulations. Our approach is…”
    Get full text
    Journal Article
  15. 15

    A Comparative Study of Surface-Roughness-Induced Variability in Silicon Nanowire and Double-Gate FETs by Cresti, A., Pala, M. G., Poli, S., Mouis, M., Ghibaudo, G.

    Published in IEEE transactions on electron devices (01-08-2011)
    “…We study the effect of surface roughness (SR) at the Si/SiO 2 interfaces on transport properties of quasi 1-D and 2-D silicon nanodevices by comparing the…”
    Get full text
    Journal Article
  16. 16

    Size Dependence of Surface-Roughness-Limited Mobility in Silicon-Nanowire FETs by Poli, S., Pala, M.G., Poiroux, T., Deleonibus, S., Baccarani, G.

    Published in IEEE transactions on electron devices (01-11-2008)
    “…Lateral size effects on surface-roughness-limited mobility in silicon-nanowire FETs are analyzed by means of a full- quantum 3-D self-consistent simulation. A…”
    Get full text
    Journal Article
  17. 17

    Channel-Length Dependence of Low-Field Mobility in Silicon-Nanowire FETs by Poli, S., Pala, M.G.

    Published in IEEE electron device letters (01-11-2009)
    “…We investigate the role of two main scattering mechanisms responsible for mobility degradation in ultrashort electron devices like silicon-nanowire FETs. We…”
    Get full text
    Journal Article
  18. 18

    Three-Dimensional Real-Space Simulation of Surface Roughness in Silicon Nanowire FETs by Buran, C., Pala, M.G., Bescond, M., Dubois, M., Mouis, M.

    Published in IEEE transactions on electron devices (01-10-2009)
    “…We address the transport properties of narrow gate-all-around silicon nanowires in the presence of surface-roughness (SR) scattering at the Si/SiO 2 interface,…”
    Get full text
    Journal Article
  19. 19

    Full Quantum Treatment of Remote Coulomb Scattering in Silicon Nanowire FETs by Poli, S., Pala, M.G., Poiroux, T.

    Published in IEEE transactions on electron devices (01-06-2009)
    “…We study the influence of remote Coulomb scattering (RCS) due to trapped charges at the silicon oxide/high- kappa material interface on the electrical…”
    Get full text
    Journal Article
  20. 20

    Deterministic Method to Evaluate the Threshold Voltage Variability Induced by Discrete Trap Charges in Si-Nanowire FETs by Bekaddour, A., Pala, M. G., Chabane-Sari, N., Ghibaudo, G.

    Published in IEEE transactions on electron devices (01-05-2012)
    “…We present a theoretical study of the trap-charge-induced variability of threshold voltage in silicon-nanowire FETs. By exploiting full-quantum 3-D…”
    Get full text
    Journal Article