Search Results - "Pala, Marco G"
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1
Full-Band Quantum Transport of Heterojunction Electron Devices With Empirical Pseudopotentials
Published in IEEE transactions on electron devices (01-12-2020)“…This article presents the methodology, implementation, and application of a full-band quantum transport model based on the nonequilibrium Green's function…”
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2
A Steep-Slope MoS2-Nanoribbon MOSFET Based on an Intrinsic Cold-Contact Effect
Published in IEEE electron device letters (01-09-2019)“…We propose a steep-slope MoS 2 -nanoribbon field-effect transistor that exploits a narrow-energy conduction band to intrinsically filter out the thermionic…”
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3
Interface Traps in InAs Nanowire Tunnel FETs and MOSFETs-Part II: Comparative Analysis and Trap-Induced Variability
Published in IEEE transactions on electron devices (01-09-2013)“…This paper extends the analysis of the companion paper by presenting a comparative analysis of the impact of interface traps on the I-V characteristics of InAs…”
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4
Interface Traps in InAs Nanowire Tunnel-FETs and MOSFETs-Part I: Model Description and Single Trap Analysis in Tunnel-FETs
Published in IEEE transactions on electron devices (01-09-2013)“…This paper and the companion work present a full quantum study of the influence of interface traps on the I-V characteristics of InAs nanowire Tunnel-field…”
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5
Essential Physics of the OFF-State Current in Nanoscale MOSFETs and Tunnel FETs
Published in IEEE transactions on electron devices (01-09-2015)“…We present a study about of the essential physical elements governing the OFF-state current in MOSFETs and tunnel FETs at truly nanoscale dimensions. By…”
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6
Assessment of the Electrical Performance of Short Channel InAs and Strained Si Nanowire FETs
Published in IEEE transactions on electron devices (01-05-2017)“…We present a numerical study aimed to benchmark short gate InAs nanowire-FETs (NW-FETs) against their strained Si (sSi) counterpart. Our full-quantum…”
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7
Operation and Design of van der Waals Tunnel Transistors: A 3-D Quantum Transport Study
Published in IEEE transactions on electron devices (01-11-2016)“…We propose a model Hamiltonian for van der Waals tunnel transistors (vdW-TFETs) relying on few physical parameters calibrated against density functional theory…”
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8
Large On-Current Enhancement in Hetero-Junction Tunnel-FETs via Molar Fraction Grading
Published in IEEE electron device letters (01-02-2014)“…We propose to employ a grading of the molar fraction in the source region of III-V hetero-junction tunnel-FETs as a means to improve the on-current without…”
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9
Superconducting proximity effect in interacting quantum dots revealed by shot noise
Published in Solid state communications (01-01-2011)“…We study the full counting statistics of charge transport through a quantum dot tunnel coupled to one normal and one superconducting lead with a large…”
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10
Full-Band Quantum Simulations of Semiconductor Devices based on Empirical Pseudopotential Hamiltonians in the presence of Phonon Scattering and Non-Radiative Recombination
Published in 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (27-09-2023)“…We present a full-band quantum transport model based on the Empirical Pseudopotential Method (EPM) that includes electron-phonon scattering and…”
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Conference Proceeding -
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On the origins of transport inefficiencies in mesoscopic networks
Published in Scientific reports (14-02-2018)“…A counter-intuitive behavior analogous to the Braess paradox is encountered in a two-terminal mesoscopic network patterned in a two-dimensional electron system…”
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12
Exploiting Hetero-Junctions to Improve the Performance of III-V Nanowire Tunnel-FETs
Published in IEEE journal of the Electron Devices Society (01-05-2015)“…This paper presents full-quantum 3-D simulations predicting the electrical performance of nanowire tunnel-FETs based on III-V hetero-junctions. Our…”
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13
Nonequilibrium Josephson and Andreev current through interacting quantum dots
Published in New journal of physics (23-08-2007)Get full text
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14
Impact of inelastic phonon scattering in the OFF state of Tunnel-field-effect transistors
Published in Journal of computational electronics (01-12-2016)“…We study the impact of electron–phonon interaction on the subthreshold operation region of Tunnel-FETs by means of full-quantum simulations. Our approach is…”
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15
A Comparative Study of Surface-Roughness-Induced Variability in Silicon Nanowire and Double-Gate FETs
Published in IEEE transactions on electron devices (01-08-2011)“…We study the effect of surface roughness (SR) at the Si/SiO 2 interfaces on transport properties of quasi 1-D and 2-D silicon nanodevices by comparing the…”
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16
Size Dependence of Surface-Roughness-Limited Mobility in Silicon-Nanowire FETs
Published in IEEE transactions on electron devices (01-11-2008)“…Lateral size effects on surface-roughness-limited mobility in silicon-nanowire FETs are analyzed by means of a full- quantum 3-D self-consistent simulation. A…”
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17
Channel-Length Dependence of Low-Field Mobility in Silicon-Nanowire FETs
Published in IEEE electron device letters (01-11-2009)“…We investigate the role of two main scattering mechanisms responsible for mobility degradation in ultrashort electron devices like silicon-nanowire FETs. We…”
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18
Three-Dimensional Real-Space Simulation of Surface Roughness in Silicon Nanowire FETs
Published in IEEE transactions on electron devices (01-10-2009)“…We address the transport properties of narrow gate-all-around silicon nanowires in the presence of surface-roughness (SR) scattering at the Si/SiO 2 interface,…”
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19
Full Quantum Treatment of Remote Coulomb Scattering in Silicon Nanowire FETs
Published in IEEE transactions on electron devices (01-06-2009)“…We study the influence of remote Coulomb scattering (RCS) due to trapped charges at the silicon oxide/high- kappa material interface on the electrical…”
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20
Deterministic Method to Evaluate the Threshold Voltage Variability Induced by Discrete Trap Charges in Si-Nanowire FETs
Published in IEEE transactions on electron devices (01-05-2012)“…We present a theoretical study of the trap-charge-induced variability of threshold voltage in silicon-nanowire FETs. By exploiting full-quantum 3-D…”
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