Search Results - "Ozerov, I. A"

Feulgen Testing of the Nuclei of Leaf Cells of Taxodium dubium (Cupressaceae) from the Eocene Tavda Flora of Western Siberia by Ozerov, I. A., Zhinkina, N. A., Torshilova, A. A., Machs, E. M., Rodionov, A. V.

“…The article presents the results of studying the tissues of the leaf phytoleim of the fossil Taxodium dubium from the Eocene Tavda flora of Western Siberia…”
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Statistics and methodology of multiple cell upset characterization under heavy ion irradiation by Zebrev, G.I., Gorbunov, M.S., Useinov, R.G., Emeliyanov, V.V., Ozerov, A.I., Anashin, V.S., Kozyukov, A.E., Zemtsov, K.S.

“…Mean and partial cross-section concepts and their connections to multiplicity and statistics of multiple cell upsets (MCUs) in highly-scaled digital memories…”
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Feulgen Testing of the Nuclei of Leaf Cells of Taxodium dubium by Ozerov, I. A, Zhinkina, N. A, Torshilova, A. A, Machs, E. M, Rodionov, A. V

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Multiple Cell Upset Cross-Section Uncertainty in Nanoscale Memories: Microdosimetric Approach by Zebrev, G. I., Zemtsov, K. S., Useinov, R. G., Gorbunov, M. S., Emeliyanov, V. V., Ozerov, A. I.

“…We found that the energy deposition fluctuations in the sensitive volumes may cause multiplicity scatters in the multiple cell upsets (MCU) in the nanoscale…”
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Equipment and Test Results of the Electronic Components to SEE in the Temperature Range by Anashin, V. S., Kozyukov, A. E., Emeliyanov, V. V., Ozerov, A. I., Vatuev, A. S., Besetskiy, A. V., Skuratov, V. A., Bakerenkov, A. S., Belyakov, V. V.

“…This paper presents SEE test facility as well as its opportunities of integrated microcircuit tests in the temperature range. The used method of heating and…”
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The study of the sensitivity of CMOS integrated circuits to single event latchup using pulsed bremsstrahlung by Zinchenko, V. F., Lavrentjev, K. V., Ozerov, A. I., Semenets, B. N., Chlenov, A. M.

“…The features of latchup triggering in CMOS integrated circuits (ICs) induced by high-intensity pulsed bremsstrahlung (PB) and heavy charged particles (HCP) are…”
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Multiple Cell Upset Cross-Section Uncertainty in Nanoscale Memories: Microdosimetric Approach by Zebrev, G. I, Zemtsov, K. S, Useinov, R. G, Gorbunov, M. S, Emeliyanov, V. V, Ozerov, A. I

“…We found that the energy deposition fluctuations in the sensitive volumes may cause multiplicity scatters in the multiple cell upsets in the nanoscale (with…”
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Feulgen-positive staining of the cell nuclei in fossilized leaf and fruit tissues of the Lower Eocene Myrtaceae by Ozerov, Igor A, Zhinkina, Nadezhda A, Efimov, Alexander M, Machs, Edward M, Rodionov, Alexander V

“…The Feulgen reaction and the staining of preparations with two DNA‐specific fluorochromes, Hoechst 33258 and 4′,6‐diamidino‐2‐fenilindol (DAPI), were used to…”
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Analysis of SOI CMOS microprocessor's SEE sensitivity: Correlation of the results obtained by different test methods by Gorbunov, M. S., Vasilegin, B. V., Antonov, A. A., Osipenko, P. N., Zebrev, G. I., Anashin, V. S., Emeliyanov, V. V., Ozerov, A. I., Useinov, R. G., Chumakov, A. I., Pechenkin, A. A., Yanenko, A. V.

“…The results on SEE sensitivity of 0.5 μm SOI CMOS microprocessor are presented and discussed. The comparative analysis of different test techniques (particle…”
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