Search Results - "Ostermayr, M."

Isolated proton bunch acceleration by a petawatt laser pulse by Hilz, P., Ostermayr, T. M., Huebl, A., Bagnoud, V., Borm, B., Bussmann, M., Gallei, M., Gebhard, J., Haffa, D., Hartmann, J., Kluge, T., Lindner, F. H., Neumayr, P., Schaefer, C. G., Schramm, U., Thirolf, P. G., Rösch, T .F., Wagner, F., Zielbauer, B., Schreiber, J.

“…Often, the interpretation of experiments concerning the manipulation of the energy distribution of laser-accelerated ion bunches is complicated by the…”
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Temporally Resolved Intensity Contouring (TRIC) for characterization of the absolute spatio-temporal intensity distribution of a relativistic, femtosecond laser pulse by Haffa, Daniel, Bin, Jianhui, Speicher, Martin, Allinger, Klaus, Hartmann, Jens, Kreuzer, Christian, Ridente, Enrico, Ostermayr, Tobias M., Schreiber, Jörg

“…Today’s high-power laser systems are capable of reaching photon intensities up to 10 22 W cm −2 , generating plasmas when interacting with material. The high…”
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Analysis of Read Current and Write Trip Voltage Variability From a 1-MB SRAM Test Structure by Fischer, T., Amirante, E., Huber, P., Nirschl, T., Olbrich, A., Ostermayr, M., Schmitt-Landsiedel, D.

“…We present an area efficient test structure that allows measurement of the statistical distribution of SRAM cell read currents and write trip voltages for 1…”
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Sub-cycle dynamics in relativistic nanoplasma acceleration by Cardenas, D. E., Ostermayr, T. M., Di Lucchio, L., Hofmann, L., Kling, M. F., Gibbon, P., Schreiber, J., Veisz, L.

“…The interaction of light with nanometer-sized solids provides the means of focusing optical radiation to sub-wavelength spatial scales with associated electric…”
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A feasibility study of zebrafish embryo irradiation with laser-accelerated protons by Rösch, Thomas F, Szabó, Zoltán, Haffa, Daniel, Bin, Jianhui, Brunner, Szilvia, Englbrecht, Franz S, Friedl, Anna A, Gao, Ying, Hartmann, Jens, Hilz, Peter, Kreuzer, Christian, Lindner, Florian H, Ostermayr, Tobias M, Polanek, Róbert, Speicher, Martin, Szabó, Emília R, Taray, Derya, Tőkés, Tünde, Würl, Matthias, Parodi, Katia, Hideghéty, Katalin, Schreiber, Jörg

“…The development from single shot basic laser plasma interaction research toward experiments in which repetition rated laser-driven ion sources can be applied…”
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Laser-driven x-ray and proton micro-source and application to simultaneous single-shot bi-modal radiographic imaging by Ostermayr, T. M., Kreuzer, C., Englbrecht, F. S., Gebhard, J., Hartmann, J., Huebl, A., Haffa, D., Hilz, P., Parodi, K., Wenz, J., Donovan, M. E., Dyer, G., Gaul, E., Gordon, J., Martinez, M., Mccary, E., Spinks, M., Tiwari, G., Hegelich, B. M., Schreiber, J.

“…Radiographic imaging with x-rays and protons is an omnipresent tool in basic research and applications in industry, material science and medical diagnostics…”
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An automated, 0.5 Hz nano-foil target positioning system for intense laser plasma experiments by Gao, Ying, Bin, Jianhui, Haffa, Daniel, Kreuzer, Christian, Hartmann, Jens, Speicher, Martin, Lindner, Florian H., Ostermayr, Tobias M., Hilz, Peter, Rösch, Thomas F., Lehrack, Sebastian, Englbrecht, Franz, Seuferling, Sebastian, Gilljohann, Max, Ding, Hao, Ma, Wenjun, Parodi, Katia, Schreiber, Jörg

“…We report on a target system supporting automated positioning of nano-targets with a precision resolution of $4~\unicode[STIX]{x03BC}\text{m}$ in three…”
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MALTY––A memory test structure for analysis in the early phase of the technology development by Nirschl, Th, Ostermayr, M., Olbrich, A., Vietzke, D., Omer, M., Linnenbank, C., Schaper, U., Pottgiesser, Y., Pottgiesser, J., Johansson, M., Simon, U., Joens, A.

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The tunneling field effect transistor (TFET) as an add-on for ultra-low-voltage analog and digital processes by Nirschl, Th, Wang, P.-F., Weber, C., Sedlmeir, J., Heinrich, R., Kakoschke, R., Schrufer, K., Holz, J., Pacha, C., Schulz, T., Ostermayr, M., Olbrich, A., Georgakos, G., Ruderer, E., Hansch, W., Schmitt-Landsiedel, D.

“…This work presents tunneling field effect transistors (TFET) fabricated with 130nm and 90nm process flows. Good performance of the TFET is achieved. A novel…”
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Competitive and cost effective high-k based 28nm CMOS technology for low power applications by Arnaud, F., Thean, A., Eller, M., Lipinski, M., Teh, Y.W., Ostermayr, M., Kang, K., Kim, N.S., Ohuchi, K., Han, J.-P., Nair, D.R., Lian, J., Uchimura, S., Kohler, S., Miyaki, S., Ferreira, P., Park, J.-H., Hamaguchi, M., Miyashita, K., Augur, R., Zhang, Q., Strahrenberg, K., ElGhouli, S., Bonnouvrier, J., Matsuoka, F., Lindsay, R., Sudijono, J., Johnson, F.S., Ku, J.H., Sekine, M., Steegen, A., Sampson, R.

“…In this paper, we present a cost-effective 28 nm CMOS technology for low power (LP) applications based on a high-k, single-metal-gate-first architecture. We…”
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Investigation of Increased Multi-Bit Failure Rate Due to Neutron Induced SEU in Advanced Embedded SRAMs by Georgakos, G., Huber, P., Ostermayr, M., Amirante, E., Ruckerbauer, F.

“…This paper reports a dramatically increased multi-bit failure rate due to neutron induced single event upset (SEU) in 65 nm triple-well embedded SRAMs. Based…”
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En-route to the fission-fusion reaction mechanism: a status update on laser-driven heavy ion acceleration by Lindner, F. H, McCary, E, Jiao, X, Ostermayr, T. M, Roycroft, R, Tiwari, G, Hegelich, B. M, Schreiber, J, Thirolf, P. G

“…The fission-fusion reaction mechanism was proposed in order to generate extremely neutron-rich nuclei close to the waiting point N = 126 of the rapid neutron…”
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Predicting Failure Distributions of SRAM Arrays by using Extreme Value Statistic, Bit Cell Simulation, and Machine Learning by Pompl, T., Bashir, T. Khan, Voelker, M., Last, F., Ostermayr, M.

“…We present a successful methodology for accurately predicting failure distributions of SRAM arrays based on simulation results of a single bit cell. This was…”
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A novel approach to electron data background treatment in an online wide-angle spectrometer for laser-accelerated ion and electron bunches by Lindner, F. H, Bin, J. H, Englbrecht, F, Haffa, D, Bolton, P. R, Gao, Y, Hartmann, J, Hilz, P, Kreuzer, C, Ostermayr, T. M, Rösch, T. F, Speicher, M, Parodi, K, Thirolf, P. G, Schreiber, J

“…REVIEW OF SCIENTIFIC INSTRUMENTS 89, 013301 (2018) Laser-based ion acceleration is driven by electrical fields emerging when target electrons absorb laser…”
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A 65nm test structure for the analysis of NBTI induced statistical variation in SRAM transistors by Fischer, T., Amirante, E., Hofmann, K., Ostermayr, M., Huber, P., Schmitt-Landsiedel, D.

“…We present the results of a test structure that allows to measure the variation of SRAM p-MOS and n-MOS transistors in a dense environment and to apply…”
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I-BEAT: Ultrasonic method for online measurement of the energy distribution of a single ion bunch by Haffa, Daniel, Yang, Rong, Bin, Jianhui, Lehrack, Sebastian, Brack, Florian-Emanuel, Ding, Hao, Englbrecht, Franz S., Gao, Ying, Gebhard, Johannes, Gilljohann, Max, Götzfried, Johannes, Hartmann, Jens, Herr, Sebastian, Hilz, Peter, Kraft, Stephan D., Kreuzer, Christian, Kroll, Florian, Lindner, Florian H., Metzkes-Ng, Josefine, Ostermayr, Tobias M., Ridente, Enrico, Rösch, Thomas F., Schilling, Gregor, Schlenvoigt, Hans-Peter, Speicher, Martin, Taray, Derya, Würl, Matthias, Zeil, Karl, Schramm, Ulrich, Karsch, Stefan, Parodi, Katia, Bolton, Paul R., Assmann, Walter, Schreiber, Jörg

“…The shape of a wave carries all information about the spatial and temporal structure of its source, given that the medium and its properties are known. Most…”
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Particle-In-Cell simulation of laser irradiated two-component microspheres in 2 and 3 dimensions by Pauw, Viktoria, Ostermayr, Tobias M., Bamberg, Karl-Ulrich, Böhl, Patrick, Deutschmann, Fabian, Kiefer, Daniel, Klier, Constantin, Moschüring, Nils, Ruhl, Hartmut

“…We examine proton acceleration from spherical carbon-hydrogen targets irradiated by a relativistic laser pulse. Particle-In-Cell (PIC) simulations are carried…”
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Towards swift ion bunch acceleration by high-power laser pulses at the Centre for Advanced Laser Applications (CALA) by Lindner, F.H., Haffa, D., Bin, J.H., Englbrecht, F., Gao, Y., Gebhard, J., Hartmann, J., Hilz, P., Kreuzer, C., Lehrack, S., Ostermayr, T.M., Rösch, T.F., Speicher, M., Würl, M., Parodi, K., Schreiber, J., Thirolf, P.G.

“…Laser-driven acceleration of ions has inspired novel applications, that can benefit from ion bunch properties different from conventionally (non-laser based)…”
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Strategies for single patterning of contacts for 32nm and 28nm technology by Morgenfeld, B., Stobert, I., Haffner, H., An, J., Kanai, H., Ostermayr, M., Chen, N., Aminpur, M., Brodsky, C., Thomas, A.

“…As 193 nm immersion lithography is extended indefinitely to sustain technology roadmaps, there is increasing pressure to contain escalating lithography costs…”
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Fast stability analysis of large-scale SRAM arrays and the impact of NBTI degradation by Drapatz, S., Fischer, T., Hofmann, K., Amirante, E., Huber, P., Ostermayr, M., Georgakos, G., Schmitt-Landsiedel, D.

“…This paper presents read margin analysis for large SRAM arrays with a fast test method that even can be realized in dual-V DD product chips. Classical Static…”
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