Search Results - "Orloff, J. H."
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Pt and W ohmic contacts to p-6H-SiC by focused ion beam direct-write deposition
Published in Journal of electronic materials (01-03-1999)“…Low resistance Pt and W ohmic metallizations to p-type 6H-SiC, using focused ion beam (FIB) surface-modification and in-situ direct-write metal deposition…”
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Journal Article -
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Ohmic contacts to p-6H–SiC using focused ion-beam surface-modification and pulsed laser epitaxial TiN deposition
Published in Applied physics letters (14-12-1998)“…The development of low-resistance Ohmic metallizations to p-type 6H–SiC, using a focused ion-beam (FIB)-Ga surface-modification and ex situ pulsed laser (PLD)…”
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Journal Article -
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Focused ion beam assisted ohmic metallizations to p-6H-SiC
Published in Compound Semiconductors 1997. Proceedings of the IEEE Twenty-Fourth International Symposium on Compound Semiconductors (1997)“…This work deals with the development of high temperature, low resistance ohmic metallizations to p-type 6H-SiC, using a novel approach of focused ion beam…”
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Conference Proceeding -
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Nuclear structure of K 46 : Studies with Ca 48 ( d , α γ ) K 46 and deuteron-transfer reactions
Published in Physical review. C, Nuclear physics (01-07-1974)Get full text
Journal Article