Search Results - "Oliveira, Alberto V."

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  1. 1

    Low-Frequency Noise in Vertically Stacked Si n-Channel Nanosheet FETs by de Oliveira, Alberto V., Veloso, Anabela, Claeys, Cor, Horiguchi, Naoto, Simoen, Eddy

    Published in IEEE electron device letters (01-03-2020)
    “…This manuscript presents a systematic low-frequency noise analysis of inversion-mode vertically stacked silicon n-channel nanosheet MOSFETs on bulk wafers…”
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    Journal Article
  2. 2

    Low-Frequency Noise Characterization of Germanium n-Channel FinFETs by de Oliveira, Alberto V., Xie, Duan, Arimura, Hiroaki, Boccardi, Guillaume, Collaert, Nadine, Claeys, Cor, Horiguchi, Naoto, Simoen, Eddy

    Published in IEEE transactions on electron devices (01-07-2020)
    “…This article presents an experimental, room temperature, low-frequency noise characterization of germanium n-channel fin-field-effect transistors (finFETs)…”
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  3. 3

    Low-Frequency Noise Assessment of Different Ge pFinFET STI Processes by de Oliveira, Alberto V., Simoen, Eddy, Mitard, Jerome, Agopian, Paula G. D., Martino, Joao Antonio, Langer, Robert, Witters, Liesbeth, Collaert, Nadine, Thean, Aaron Voon-Yew, Claeys, Cor

    Published in IEEE transactions on electron devices (01-10-2016)
    “…An experimental low-frequency noise (LFN) assessment of long channel Ge pFinFET devices fabricated in different shallow trench isolation (STI) processes is…”
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  4. 4

    GR-Noise Characterization of Ge pFinFETs With STI First and STI Last Processes by Oliveira, Alberto V., Simoen, Eddy, Mitard, Jerome, Agopian, Paula G. D., Martino, Joao A., Langer, Robert, Witters, Liesbeth J., Collaert, Nadine, Thean, Aaron, Claeys, Cor

    Published in IEEE electron device letters (01-09-2016)
    “…This letter characterizes the generation- recombination noise of Ge pFinFETs, for three different integration schemes: shallow trench isolation (STI) first…”
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    Journal Article
  5. 5

    Exophthalmos due to odontogenic intraorbital abscess in Cebus apella by Oriá, Arianne P., Pinna, Melissa H., Estrela‐Lima, Alessandra, Junior, Deusdete G., Libório, Fernanda A., Assis Dórea Neto, Francisco, Oliveira, Alberto V. D., Nogueira, Marcos, Requião, Katia

    Published in Journal of medical primatology (01-04-2013)
    “…Background The accumulation of pus in the orbit originating from an infected dental root is classified as odontogenic intraorbital abscess. Methods Clinical,…”
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    Journal Article
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