Efficient Reduction of Standby Leakage Current in LSIs for Use in Mobile Devices

Efficient Reduction of Standby Leakage Current in LSIs for Use in Mobile Devices

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Bibliographic Details
Published in:Japanese Journal of Applied Physics Vol. 45; no. 4S; p. 3150
Main Authors: Kudo, Hiroshi, Ishikawa, Kenji, Mishima, Yasuyoshi, Satou, Shigeru, Kihara, Fukuji, Okamato, Masayuki, Ito, Tetsuya, Suzuki, Yoshiyuki, Nomura, Toshio, Kawano, Michiari, Nishikawa, Katsunari, Ozaki, Yoshihiro
Format: Journal Article
Language:English
Published: 01-04-2006
Online Access:Get full text
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Description
ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.45.3150